Proceedings of the 2016 24th ACM SIGSOFT International Symposium on Foundations of Software Engineering 2016
DOI: 10.1145/2950290.2950353
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Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models

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Cited by 204 publications
(219 citation statements)
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References 42 publications
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“…They say a "good" defect predictor selects the 20% of files containing 80% of the defects In the literature, this 20/80 rule is often called P opt 20 (the percent of the bugs found after reading 20%). P opt 20 is widely used in the literature and, for details on that measure, we refer the reader to those publications [18], [42], [48], [62], [64], [69], [69], [111]. For this paper, all we need to say about P opt 20 is the conclusions reached from this metric are nearly the same as the conclusions reached via G-score.…”
Section: Evaluation Criteriamentioning
confidence: 98%
“…They say a "good" defect predictor selects the 20% of files containing 80% of the defects In the literature, this 20/80 rule is often called P opt 20 (the percent of the bugs found after reading 20%). P opt 20 is widely used in the literature and, for details on that measure, we refer the reader to those publications [18], [42], [48], [62], [64], [69], [69], [111]. For this paper, all we need to say about P opt 20 is the conclusions reached from this metric are nearly the same as the conclusions reached via G-score.…”
Section: Evaluation Criteriamentioning
confidence: 98%
“…Kamei's features contain 14 features in total, which have been proposed and validated by Kamei et al and used by Yang et al, and Yang et al in change classification. Kamei's features are divided into diffusion, size, purpose, history, and experience dimensions.…”
Section: Change Classification Methodologymentioning
confidence: 99%
“…For effort‐aware just‐in‐time bug prediction, Yang et al found that simple unsupervised models could be better than supervised models. However, Huang et al showed that the method proposed by Yang et al has some disadvantages so they proposed an improved supervised model called CBS , which is better than the state‐of‐the‐art supervised model(ie, EALR ). At the same time, compared with the LT method proposed by Yang et al, CBS can also get significant reduces on context switches and false alarms when obtaining similar recall.…”
Section: Related Workmentioning
confidence: 99%
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“…Additionally, researchers have turned their attention to how defect prediction research should be conducted, e.g., reducing the bias through sampling approaches [10], the impact of hyper parameter tuning [11], suitable baseline comparisons [12] or general guidelines that should be considered [13]. While all of the above contribute to the advancement of the defect prediction state of the art, there are also multiple publications that question the progress of the state of the art through replications in recent years, as they demonstrate that older (e.g., [4]) or trivial (e.g., [14], [15]) approaches are comparable too or even better than more complex recent approaches from the state of the art.…”
Section: Introductionmentioning
confidence: 99%