1948
DOI: 10.1007/978-3-7091-3636-2
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Einführung in die Gefügekunde der Geologischen Körper

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Cited by 49 publications
(20 citation statements)
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“…Details on these techniques can be found in the Appendix A. While X-ray diffraction allows a volume-related, quantitative texture analysis, the CIP-method gives instead a grain-or microstructural domain-related determination of the c-axis directions, which can be visualized by an "Achsenverteilungsanalyse" (AVA, axis distribution analysis) [e.g., Sander, 1950;Trommsdorf and Wenk, 1963]. The thin sections used for the CIP analysis (and for the microstructural analysis) were prepared from mirror sample chips of those used for the X-ray analysis.…”
Section: Methodsmentioning
confidence: 99%
“…Details on these techniques can be found in the Appendix A. While X-ray diffraction allows a volume-related, quantitative texture analysis, the CIP-method gives instead a grain-or microstructural domain-related determination of the c-axis directions, which can be visualized by an "Achsenverteilungsanalyse" (AVA, axis distribution analysis) [e.g., Sander, 1950;Trommsdorf and Wenk, 1963]. The thin sections used for the CIP analysis (and for the microstructural analysis) were prepared from mirror sample chips of those used for the X-ray analysis.…”
Section: Methodsmentioning
confidence: 99%
“…2 and 3, these six orientational domains are presented by various diagonally hatched patterns and shades of gray. Note that this technique is really just a generalized form of the AVA method (Achsenverteilungsanalyse) previously described by Ramsauer (1941) and Sander (1950).…”
Section: Experimental Configuration and Conditionsmentioning
confidence: 99%
“…The OD resolution of both methods will be similar for an equivalent amount of experimental texture information (Helming et al, 1994). The c-axes form a crossed girdle as is typical of quartzites deformed at relatively low metamorphic grade (Sander, 1950 The arrangement ofthe detector banks at different 20 positions in the present experiment requires some non-trivial corrections. Different detectors see the same diffraction peak at different neutron wavelengths A.…”
Section: Introductionmentioning
confidence: 93%