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Cited by 15 publications
(9 citation statements)
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“…Details of the growth process have been described in a previous work [4]. Thickness of films measured using a Dektak II profilometer was 200 ± 10 nm.…”
Section: Methodsmentioning
confidence: 99%
“…Details of the growth process have been described in a previous work [4]. Thickness of films measured using a Dektak II profilometer was 200 ± 10 nm.…”
Section: Methodsmentioning
confidence: 99%
“…The CBD method used to grow the CdSe layers was described elsewhere [17]. The substrates employed were glass-slides, which were cleaned by immersing them into an aqueous solution of K 2 Cr 2 O 7 , diluted in concentrated HCl, during 24 h. Afterwards, they were rubbed using distilled water and free Na detergent, rinsed in deionized water and then blow-dried using filtered clean air.…”
Section: Methodsmentioning
confidence: 99%
“…Thus, stoichiometric thin films of CdSe in cubic phase were obtained similar to CdS with the same structural symmetry using the CBD technique. 13 Band structure analysis from optical absorption data evidenced two critical points at 1.84 and 2.2 eV, respectively. Theoretical calculations of band structure of cubic modification of CdSe do not predict the existence of this last electronic transition; 14,15 however, the recent experimental data of dielectric function in cubic CdSe reveal a spin-orbit split of 0.41 eV in accordance with our results.…”
mentioning
confidence: 98%