Abstract:Silicon wafers, p-and n-doped with different free-carrier charge concentrations, were selected as model materials to study a possible influence of charge-carrier concentrations (or electrical conductivity) on measured elastic electron backscattering probabilities and electron inelastic mean free paths determined by elastic peak electron spectroscopy. This research is motivated by contrast changes frequently observed in scanning electron microscopy of semiconductor structures with different types of doping (p-a… Show more
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.