2006
DOI: 10.2140/jomms.2006.1.541
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Elastic indentation problems in thin films on substrate systems

Abstract: In this paper an analytical solution of an elastic isotropic thin-film on an elastic substrate under an axisymmetric loading on the plane surface is presented. The analysis is intended to model the micronanoindentation tests to evaluate some of the relevant properties of thin films and provide information about the influence of interface conditions between the film and the substrate.The theoretical solution of the equations of three-dimensional elasticity is obtained by using Dini and Fourier-Bessel expansions… Show more

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Cited by 8 publications
(6 citation statements)
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“…It is remarked that the mathematical approach utilized to find the contact law in section 2 is very powerful and has been utilized also in [9] to find the indentation in a film/substrate system. …”
Section: Numerical Results and Conclusionmentioning
confidence: 99%
“…It is remarked that the mathematical approach utilized to find the contact law in section 2 is very powerful and has been utilized also in [9] to find the indentation in a film/substrate system. …”
Section: Numerical Results and Conclusionmentioning
confidence: 99%
“…Furthermore, this solution provides a good description of localized effects in some mechanical problems [15][16][17].…”
Section: Stress and Displacement Field In The Cylindermentioning
confidence: 97%
“…To explicitly find the elastic solution (2.7 and 2.8), in the next section, we assume boundary conditions on the free surface and on the interface film/substrate (Sburlati, 2006).…”
Section: Elastic Solutionmentioning
confidence: 99%
“…With this motivation, in this paper we propose a semi-inverse method in which we consider a perfectly elastic thin film (with and without adhesion) where, instead of assuming the displacement field in the contact area as input data, we assume the pressure distributions and the contact area radii known in the literature for the corresponding half-space models (Sburlati, 2006). This assumption allows us to overcome the mathematical difficulties involved in the exact analytical method (as a contact problem; Sneddon, 1966) and to extend the Hertzian, JKR, DMT, and MD half-space adhesion models to thin elastic films coated on elastic substrates.…”
Section: Introductionmentioning
confidence: 99%