2006
DOI: 10.1063/1.2165275
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Elastic modulus of amorphous SiO2 nanowires

Abstract: Amorphous SiO2 nanowires with diameter ranging from 50 to 100 nm were synthesized using chemical vapor deposition (CVD) under an argon atmosphere at atmospheric pressure. Nanoscale three-point bending tests were performed directly on individual amorphous SiO2 nanowires using an atomic force microscope (AFM). Elastic modulus of the amorphous SiO2 nanowires was measured to be 76.6±7.2GPa, which is close to the reported value of the bulk SiO2 and thermally grown SiO2 thin films, but lower than that of plasma-enha… Show more

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Cited by 147 publications
(120 citation statements)
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“…To determine the elastic modulus of the amorphous SiO x nanowires, nano-scale three-point bending tests can be performed directly on individual amorphous SiO x nanowires using an atomic force microscope (AFM). Ni and Gao (2006) found that the elastic modulus of the amorphous SiO 2 nanowires was 76.6 ± 7.2 GPa. The amorphous SiO 2 nanowires also exhibited brittle fracture failure in bending.…”
Section: Elastic Modulus Of Sio X Nanowiresmentioning
confidence: 99%
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“…To determine the elastic modulus of the amorphous SiO x nanowires, nano-scale three-point bending tests can be performed directly on individual amorphous SiO x nanowires using an atomic force microscope (AFM). Ni and Gao (2006) found that the elastic modulus of the amorphous SiO 2 nanowires was 76.6 ± 7.2 GPa. The amorphous SiO 2 nanowires also exhibited brittle fracture failure in bending.…”
Section: Elastic Modulus Of Sio X Nanowiresmentioning
confidence: 99%
“…Some of these properties are summarized in the (Wei et al, 2006, Jin et al, 2008, Ni et al, 2006and Bilalbegović, 2006.…”
Section: Properties Of Sio X Nanowiresmentioning
confidence: 99%
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“…For various a-SiO x compositions, these two moduli were successfully evaluated by first-principles calculations using a statistical approach in our previous work 63 and the endpoint cases (x = 0 and 2) have been wellcharacterized through experimental measurements. [64][65][66][67][68][69] Additional mechanical properties, such as the Poisson ratio (ν) and shear modulus (G), can be calculated once Y and B are known because only two of these four quantities are independent in isotropic materials. 63 We apply our previously reported moduli calculation method to VFF total energy data to evaluate Y and B based on both KT(LH) and KT(TT) potentials for a-Si and a-SiO 2 in order to quantify the degree of rigidity in respective a-Si and a-SiO 2 matrices.…”
Section: Mechanical Propertiesmentioning
confidence: 99%
“…In our systematic studies, an approximately 13% elastic strain limit for silica NWs with diameters around 50 nm was confirmed. The uniaxial tensile stress corresponding to such an elastic strain limit would be 9.5 GPa (assuming a Young's modulus of 73 GPa for silica NWs [22]). Recent results have revealed that the movement of atomic clusters (or atoms) and open volumes directly results in large elastic strain [19].…”
mentioning
confidence: 99%