2007
DOI: 10.1016/j.mechmat.2006.11.001
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Elasto-viscoplastic nonlocal damage modelling of thermal fatigue in anisotropic lead-free solder

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Cited by 22 publications
(14 citation statements)
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“…Thermal fatigue is still a major issue in many industrial activities, as proven by very recent publications on this subject in aircraft [1,2], automotive [3,4], metal forming [5][6][7], braking [8][9][10], electronic [11,12] and nuclear [13][14][15][16] industries.…”
Section: Introductionmentioning
confidence: 99%
“…Thermal fatigue is still a major issue in many industrial activities, as proven by very recent publications on this subject in aircraft [1,2], automotive [3,4], metal forming [5][6][7], braking [8][9][10], electronic [11,12] and nuclear [13][14][15][16] industries.…”
Section: Introductionmentioning
confidence: 99%
“…Each parameter is usually interpolated between the limit values known for each phase. This is the formulation adopted in the finite element simulations of Cahn-Hilliard like equations coupled with viscoplasticity in [38,39] for tin-lead solders. The same methodology is used in [19,20] ε at this material point must then be averaged or interpolated from the values attributed to each phase.…”
Section: Phase-field Models For Elastoviscoplastic Materialsmentioning
confidence: 99%
“…The effect of microelasticity on the morphological aspects and kinetics of phase transformation is classically studied but the occurrence of plasticity is recent [19,20,38]. Beyond plasticity, damage and crack propagation are the subject of both generalized continuum and phase-field approaches [6,17,31,32,39]. Phase-field simulations usually rely on finite differences or fast Fourier methods.…”
Section: Introductionmentioning
confidence: 99%
“…During the thermal cycling of polycrystalline Sn, this CTE anisotropy leads to plastic deformation concentrated near grain boundaries where there is CTE mismatch and the expansion is constrained [12,13]. In the more complex situation of BGA joints, CTE mismatch-induced cracking near the chip-side solder-substrate interface is a widespread failure mode and occurs by a combination of creep, recovery and recrystallization [3,[14][15][16][17].…”
Section: Introductionmentioning
confidence: 99%