The transport and thermodynamic properties of gas under contaminated conditions with Cu and PTFE vapours have been determined taking into account the new introduction of molecular particles, produced by chemical interactions between gas and impurities like CuF, , and , making in total 25 species. The main concern of this work is to predict, from the obtained material properties data, the transient behaviour of gas wall-stabilized arcs with these types of contamination that inevitably happen in gas circuit breakers during arc interruption. The results indicate that the electron density and the electrical conductivity increase with Cu vapour contamination, especially below 9000 K, due to the lower ionization potential of Cu atoms, but are almost invariant with PTFE contamination. The thermal conductivity changes only at higher admixture ratios above around 10% for both impurities. Typical increases in due to molecular dissociation have been found at temperatures around 4000 K for Cu vapour and at 3000 - 8000 K for PTFE vapour contamination. The transient behaviours of contaminated gas arcs have been analysed for step-current modulation in the wall-stabilized arcs under the condition of no gas flow. The greater value of arc conductance with Cu vapour contamination broadens the arc current channel, exposing possible disturbance of the current interruption function in gas circuit breakers. PTFE vapour contamination does not affect the arc decay process in wall-stabilized arcs significantly.