“…τ d and τ o denote the displacement relaxation time and reorientation relaxation time, respectively, and χ d and χ o are the displacement and reorientation polarization rates, respectively. The construction of the lattice phonon dielectric response model and the PNRs reorientation-induced dielectric response model yields as follows where E dc is the bias electric field, P s is the polarization strength of the electric dipole, L s is the size of the electric dipole, k B is the Boltzmann constant, n is the number of phonons, L e is the size of the PNRs, P e is the polarization strength of the PNRs, E co is the coercivity field to be overcome for PNR reorientation, and m is the number of PNRs. ε is the total dielectric response contributed by lattice phonon polarization and the PNR reorientation, which is positively correlated with the number of phonons n. As shown in Figure c, the cell model of KTN was simulated using VESTA, and the increase in dielectric constant is attributed to the intensity of polarization, reflecting an increasing content of Nb atoms from left to right, in agreement with the results observed by polarized light microscopy.…”