2013
DOI: 10.7566/jpsj.82.093707
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Electric-Field-Induced Insulator–Metal Transition in Ca2RuO4Probed by X-ray Absorption and Emission Spectroscopy

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Cited by 9 publications
(4 citation statements)
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“…The corresponding optical micrograph shows that the sample is insulating (visibly bright) at zero voltage. This phase is labeled as the S phase to be consistent with the previously reported S-Pbca lattice structure of the insulating phase [33,34]. At slightly above 5 V, the current discontinuously jumps to a higher value.…”
Section: A Macroscopic Imagingsupporting
confidence: 87%
“…The corresponding optical micrograph shows that the sample is insulating (visibly bright) at zero voltage. This phase is labeled as the S phase to be consistent with the previously reported S-Pbca lattice structure of the insulating phase [33,34]. At slightly above 5 V, the current discontinuously jumps to a higher value.…”
Section: A Macroscopic Imagingsupporting
confidence: 87%
“…2(b), a selection of V − I characteristics as a func- tion of T obtained by I biasing the sample along the c axis is shown on a double logarithmic scale. Beyond the low J regime, when the samples show a clear insulating behavior, a negative differential resistance is observed 26,30 , in accordance with the dramatic reduction of resistivity observed in the ρ(T ) curves by increasing J. By further increasing the current, an ohmic dependence, signature of the IMT, is expected 15 .…”
Section: A Electrical Transport Measurementssupporting
confidence: 71%
“…This occurs because a higher power is dissipated in the sample due to its increased resistance. The drop of more than one order of magnitude in j all-met indicates large and irreversible changes in the sample properties, consistent with the previous observation of crack formation at similar current values [40].…”
Section: Current-driven Mit In the Presence Of Cracks And Defectssupporting
confidence: 91%