2015
DOI: 10.1038/srep14678
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Electric-field-induced local and mesoscale structural changes in polycrystalline dielectrics and ferroelectrics

Abstract: The atomic-scale response of dielectrics/ferroelectrics to electric fields is central to their functionality. Here we introduce an in situ characterization method that reveals changes in the local atomic structure in polycrystalline materials under fields. The method employs atomic pair distribution functions (PDFs), determined from X-ray total scattering that depends on orientation relative to the applied field, to probe structural changes over length scales from sub-Ångstrom to several nanometres. The PDF is… Show more

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Cited by 65 publications
(34 citation statements)
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“…This inference received support from the recent in situ studies of field-induced structural changes in NBT using X-ray total scattering measurements during application of electric field [15]. The occurrence of the monoclinic-rhombohedral transition was evidenced both by Rietveld refinements using the diffraction patterns and by analysis of the corresponding PDFs which revealed abrupt changes in the distributions of Bi-Ti bond distances, consistent with subsequent reorientation of the rhombohedral ferroelectric domains expected upon poling [15].…”
Section: Introductionmentioning
confidence: 75%
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“…This inference received support from the recent in situ studies of field-induced structural changes in NBT using X-ray total scattering measurements during application of electric field [15]. The occurrence of the monoclinic-rhombohedral transition was evidenced both by Rietveld refinements using the diffraction patterns and by analysis of the corresponding PDFs which revealed abrupt changes in the distributions of Bi-Ti bond distances, consistent with subsequent reorientation of the rhombohedral ferroelectric domains expected upon poling [15].…”
Section: Introductionmentioning
confidence: 75%
“…The occurrence of the monoclinic-rhombohedral transition was evidenced both by Rietveld refinements using the diffraction patterns and by analysis of the corresponding PDFs which revealed abrupt changes in the distributions of Bi-Ti bond distances, consistent with subsequent reorientation of the rhombohedral ferroelectric domains expected upon poling [15].…”
Section: Introductionmentioning
confidence: 92%
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