2000
DOI: 10.1016/s0921-4526(00)00428-2
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Electric-field-induced muonium formation in sapphire

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Cited by 15 publications
(27 citation statements)
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“…The delay is caused by the duration of the relaxation process and is not due to the delayed capture or loss of an electron, as suggested in other publications (e.g., Refs. [7,9,15,27]). The seemingly diamagnetic character of the fast relaxing signal is due to an almost vanishing average value of the fluctuating hyperfine interaction.…”
Section: Discussionmentioning
confidence: 99%
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“…The delay is caused by the duration of the relaxation process and is not due to the delayed capture or loss of an electron, as suggested in other publications (e.g., Refs. [7,9,15,27]). The seemingly diamagnetic character of the fast relaxing signal is due to an almost vanishing average value of the fluctuating hyperfine interaction.…”
Section: Discussionmentioning
confidence: 99%
“…1) shows a precession frequency which is similar to the frequency of the diamagnetic state and has therefore been assigned to either Mu + or Mu − (for example, Refs. [7,9,13,15]). It was, however, not tested whether the state is really diamagnetic or is actually paramagnetic with an average hyperfine interaction so small that the hyperfine splitting cannot be observed.…”
Section: Usual Interpretation Of the Fast Relaxing Signalmentioning
confidence: 99%
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“…Muonium in Al 2 O 3 could only be inferred somewhat indirectly, posing a long-standing puzzle about its precise formation mechanismlately with the added contention that this may involve an interplay with the negative ion, i.e. the hydride-ion analogue (Minaichev et al 1970a, 1970b, Kreitzman et al 1986, Storchak et al 1997, Brewer et al 2000. Observation of muonium in fine oxide powders (Al 2 O 3 , MgO and SiO 2 ) raises quite different issues of surface mechanisms that are also still unresolved (Kiefl et al 1982, Harshman 1986, Donnelly et al 2006.…”
Section: Oxide Muonicsmentioning
confidence: 99%