Electric Field Strengths at Totally Reflecting Interfaces

Total internal reflection spectroscopy for studying soft matter

“…For ATR techniques the absorption of light by the second medium must be accounted for. This correction is often made under the thin film assumption (equation 14) or is assumed to be proportional to concentration (equation 13), which is valid at low concentrations or for weakly absorbing media. ATR techniques cause the absorption bands to shift to lower wavenumbers, relative to maxima in the complex refractive index.…”

Stratified Dipole‐Arrays Model Accounting for Bulk Properties Specific to Perfluoroalkyl Compounds

“…The bulk sample spectra were measured by using the attenuated total-reflection (ATR) technique. [24][25][26] Notably, the ATR spectra are linear combinations of both transverse optic (TO; Im(e)) and longitudinal optic (LO; Im(À1/e)) energy-loss functions (e: complex electric permittivity). [24] Because the RA spectra of a thin film are governed by the LO function only, [24,27,28] the TO contribution to the raw ATR spectra ( Figure S1 in the Supporting Information) was removed to leave the LO energy-loss function spectra ( Figure 5) by calculating e from the Kramers-Kronig relationship [24,27,29] with n = 1.33.…”

An Investigation of the Techniques of Ellipsometry, Internal Reflection Spectroscopy, and Moment Analysis to the Study of Films and Substrates

“…These effective depths may also be used in certain cases to obtain good approximate values of the optical constants of the sample (Ref. 44). The accurate determination of the optical constants may require several experimental runs, however, as well as an analysis of the data using Eq.…”

“…Approximate solutions for the optical properties of weakly absorbing media are useful and easily obtainable, however, using the concept of effective thickness (Ref. 44). These are found in the next section.…”