IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586)
DOI: 10.1109/ivmc.2001.939677
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Electrical aging of molybdenum field emitter

Abstract: As an approach to improve the stability of.molybdenum field emitters with rough surfaces and impurities at tip apex, electrical aging was studied on the basis of the important tip heating mechanism, Nottingham effect, under DC bias and pulse. The poor stability was remarkably improved using the change of tip temperature controlled by the electric field applied to tip.

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