A series of Ti 0.9 Fe 0.1−x Cr x O 2 (where x = 0.0, 0.02, 0.04, 0.6, 0.08, 0.10) was synthesized using the powder metallurgy route. The structural, morphological, magnetic, optical and electrical properties were investigated by X-ray diffractometry (XRD), Raman spectroscopy, scanning electron microscopy (SEM), vibrating sample magnetometry (VSM), UV-Vis spectroscopy and four probe technique, respectively. The rutile phase was confirmed by XRD analysis which was also verified by Raman spectroscopy. It was observed that the grain size increased as the concentration of Cr increased. M-H loops extracted from VSM analysis revealed anti-ferromagnetic, weak ferromagnetic and paramagnetic behaviors at room temperature. The band gap energy and resistivity measurements exhibited the semiconducting nature of Ti 0.9 Fe 0.1−x Cr x O 2 based diluted magnetic semiconductors.