2014
DOI: 10.1007/s10825-014-0574-z
|View full text |Cite
|
Sign up to set email alerts
|

Electrical characterization and parameter extraction of organic thin film transistors using two dimensional numerical simulations

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

1
7
0

Year Published

2016
2016
2023
2023

Publication Types

Select...
7
2

Relationship

1
8

Authors

Journals

citations
Cited by 21 publications
(8 citation statements)
references
References 30 publications
1
7
0
Order By: Relevance
“…The I – V curves show Ohmic characteristics even under a large strain, suggesting that the mobility modulation in organic single-crystal nanowires was enabled over a wide range of strains without device failure. The measured carrier mobilities were not affected by device contact resistance according to our estimates of the contact resistances by the modified transfer length method (M-TLM), which is a typical method used for measuring the parasitic contact resistance in organic transistors. , The estimated contact resistance was negligible compared to the total device resistance, and the contact resistances under different strain conditions were comparable (Figure S4) despite the significant differences in mobility under the two strain conditions, indicating that the measured mobility was modulated mostly by the intrinsic properties of the organic materials. In addition, the current was restored to its initial value when the applied strain was removed, indicating that the mobility modulation is reversible and reproducible.…”
Section: Resultsmentioning
confidence: 77%
See 1 more Smart Citation
“…The I – V curves show Ohmic characteristics even under a large strain, suggesting that the mobility modulation in organic single-crystal nanowires was enabled over a wide range of strains without device failure. The measured carrier mobilities were not affected by device contact resistance according to our estimates of the contact resistances by the modified transfer length method (M-TLM), which is a typical method used for measuring the parasitic contact resistance in organic transistors. , The estimated contact resistance was negligible compared to the total device resistance, and the contact resistances under different strain conditions were comparable (Figure S4) despite the significant differences in mobility under the two strain conditions, indicating that the measured mobility was modulated mostly by the intrinsic properties of the organic materials. In addition, the current was restored to its initial value when the applied strain was removed, indicating that the mobility modulation is reversible and reproducible.…”
Section: Resultsmentioning
confidence: 77%
“…The measured carrier mobilities were not affected by device contact resistance according to our estimates of the contact resistances by the modified transfer length method (M-TLM), which is a typical method used for measuring the parasitic contact resistance in organic transistors. 45,46 The estimated contact resistance was negligible compared to the total device resistance, and the contact resistances under different strain conditions were comparable (Figure S4) despite the significant differences in mobility under the two strain conditions, indicating that the measured mobility was modulated mostly by the intrinsic properties of the organic materials. In addition, the current was restored to its initial value when the applied strain was removed, indicating that the mobility modulation is reversible and reproducible.…”
Section: Chemistry Of Materialsmentioning
confidence: 98%
“…Following that, we conducted investigations to deeply understand how the doping affects the performance of (PEA) 2 SnI 4 FETs. First, we examined the influence of doping on contact resistance ( R C W ) in the devices through the transmission line method (TLM) ( Bhargava and Singh, 2014 ; Minari et al., 2006 ; Xu et al., 2010 ). As shown in Figure 3 F, the contact resistance for pristine devices is 9.6 × 10 4 Ω cm, and it is reduced to 1.2 × 10 4 Ω cm for the 5 mol % SnI 4 -doped devices.…”
Section: Resultsmentioning
confidence: 99%
“…In the 400 nm-long remaining region, a 3 nm thick lipid layer that hosts the receptor molecules is considered. Despite the importance of contact resistance in the context of 2DM-based FETs, [42][43][44][45][46] we have consider ohmic contacts focusing on the intrinsic physics of the sensor and how it is impacted by the molecule features. Simulations are carried out with 10 receptors uniformly distributed along the structure.…”
Section: Resultsmentioning
confidence: 99%