2013
DOI: 10.1109/jphotov.2013.2257919
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Electrical Characterization of Cu Composition Effects in CdS/CdTe Thin-Film Solar Cells With a ZnTe:Cu Back Contact

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Cited by 29 publications
(12 citation statements)
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“…1, solid lines) using methods such as deep level transient spectroscopy (DLTS), 7,8 photo-induced current transient spectroscopy (PICTS), 9 and admittance spectroscopy (AS). 10 Optical transitions (Fig. 1, dotted lines) have been observed with photoluminescence (PL) 9 as well as in this study.…”
supporting
confidence: 81%
“…1, solid lines) using methods such as deep level transient spectroscopy (DLTS), 7,8 photo-induced current transient spectroscopy (PICTS), 9 and admittance spectroscopy (AS). 10 Optical transitions (Fig. 1, dotted lines) have been observed with photoluminescence (PL) 9 as well as in this study.…”
supporting
confidence: 81%
“…A thickness of about 70 nm of ZnTe:Cu back contact layer grown by PLD under room temperature was covered on the etched CdTe layer. After that, the completed ZnTe:Cu layer was activated in the chamber of the PLD instrument with the inflated N 2 pressure of *2910 4 Pa at 200°C for 50 mins, which was able to promote the element Cu to diffuse into the junction [17,18]. Finally, Au electrode (*130 nm) was sequentially carried out by vacuum thermal evaporation [16], and then the whole solar cells were divided into many small areas of *0.0707 cm 2 .…”
Section: Methodsmentioning
confidence: 99%
“…Both C-V profiles have the U-shape characteristic of CdS/CdTe devices. 8 The differences in V OC and FF between the two ZnTe:Cu contacting processes could be due to differences in temperature profiles, which would alter Cu diffusion. For example, higher-temperature RTP annealing for very short times would yield a different diffusion profile than the longer duration of lower temperatures for the sputtered contact.…”
mentioning
confidence: 99%