2020
DOI: 10.3390/en13092165
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Electrical Characterization of MIS Schottky Barrier Diodes Based on Nanostructured Porous Silicon and Silver Nanoparticles with Applications in Solar Cells

Abstract: The accurate determination of the electrical properties of photovoltaic devices is of utmost importance to predict and optimize their overall optoelectronic performance. For example, the minority carrier lifetime and the carrier diffusion length have a strong relationship with the carrier recombination rate. Additionally, parasitic resistances have an important effect on the fill factor of a solar cell. Within this context, the alternating current (AC) and direct current (DC) electrical characteristics of Si-b… Show more

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Cited by 21 publications
(10 citation statements)
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“…The growth of ZnO thin films on PSi surfaces results in a notable enhancement in the PL properties of the composite, as previously reported [15,17,18]. However, PSi has lower electrical conduction than Si, which leads to limited conduction through optoelectronic devices [19,20]. Thus, the objective of the present work is to combine PSi and ZnO thin films to enhance PL emission properties and at the same time preserve electrical conduction.…”
Section: Introductionsupporting
confidence: 62%
“…The growth of ZnO thin films on PSi surfaces results in a notable enhancement in the PL properties of the composite, as previously reported [15,17,18]. However, PSi has lower electrical conduction than Si, which leads to limited conduction through optoelectronic devices [19,20]. Thus, the objective of the present work is to combine PSi and ZnO thin films to enhance PL emission properties and at the same time preserve electrical conduction.…”
Section: Introductionsupporting
confidence: 62%
“…(Figure S9, Supporting Information) The Nyquist plot provides interfacial resistance change, which is strongly related with carrier transport and charge separation at the junction. [ 26 ] The high frequency arc in the Nyquist plot is corresponded with charge transport resistance ( R tr ), while the low frequency arc is related with recombination resistance ( R rec ) in the p‐n junction and R s is the series resistance of electrodes. [ 27 ] The low R tr value is beneficial for carrier extraction while high R rec value is advantageous for the charge extraction in dark state.…”
Section: Resultsmentioning
confidence: 99%
“…a broad wavelength range. However, the reduction of the overall reflectance is accompanied by a decrease of electrical conductivity associated to a higher porosity and a higher oxidation degree [26,27] . As such, the combination of silicon and PSi on the active layer can be an ideal strategy to combine in the same device the optical tunability of PSi and the high electrical conductivity of highly-doped Si.…”
Section: Optical Behaviormentioning
confidence: 99%