2020
DOI: 10.1016/j.nima.2020.164456
|View full text |Cite
|
Sign up to set email alerts
|

Electrical characterization of surface properties of the ATLAS17LS sensors after neutron, proton and gamma irradiation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
10
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
5
2

Relationship

3
4

Authors

Journals

citations
Cited by 10 publications
(11 citation statements)
references
References 14 publications
1
10
0
Order By: Relevance
“…T = -20±1 ᵒC RH < 35%* *RH during testing of W013_mini4 was ~55% These results also qualitatively agree with those presented in [21] where the same dependence of leakage current on fluence is observed. The magnitude of the leakage currents in Figure 5.2 are overall lower which is likely due to uncertainties in the dosimetry between the irradiation sites (there can be up to 20% error in the calculation of equivalent proton fluence), methodology between test sites, or a combination of the two.…”
Section: Current-voltage Response Of Irradiated Minissupporting
confidence: 91%
See 3 more Smart Citations
“…T = -20±1 ᵒC RH < 35%* *RH during testing of W013_mini4 was ~55% These results also qualitatively agree with those presented in [21] where the same dependence of leakage current on fluence is observed. The magnitude of the leakage currents in Figure 5.2 are overall lower which is likely due to uncertainties in the dosimetry between the irradiation sites (there can be up to 20% error in the calculation of equivalent proton fluence), methodology between test sites, or a combination of the two.…”
Section: Current-voltage Response Of Irradiated Minissupporting
confidence: 91%
“…Finally, the discussions and evaluation of sensor properties in chapter five are completely original with the exception of MOS device theory presented in the final section of the chapter. The author has also contributed to several publications which present more results of QC testing of prototype sensors [26], a characterization of sensor surface properties after irradiation [21], a humidity sensitivity of sensors [31], and strip sensor module performance [30]. In these publications, the author's contributions may include QC and QA measurements directly made by the author (which are included in the publication).…”
Section: List Of Tablesmentioning
confidence: 99%
See 2 more Smart Citations
“…The observable changes in the sensor characteristics caused by the bulk damage are shown to increase the leakage current linearly proportional to the fluence [5][6][7], to change the full depletion voltage with the fluence [5,8,9] and to decrease the charge collection efficiency [5,9]. The charges trapped in the SiO 2 layers and the defects in the Si-SiO 2 interface are shown to be responsible for the increase of the inter-strip capacitance [5,10], decrease of the inter-strip resistance [5,7] and increase of the flat-band voltage [5]. In conclusion, the results described above clearly indicate that post-irradiation performance of the prototype sensors satisfies ATLAS requirements.…”
Section: Pos(ichep2020)892mentioning
confidence: 99%