2015
DOI: 10.1007/s10854-015-4196-4
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Electrical conductivity and dielectric characteristics of in situ prepared PVA/HgS nanocomposite films

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Cited by 82 publications
(35 citation statements)
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“…The existence of multiple diffraction peaks in the XRD pattern, confirms the polycrystalline nature of the CdO films [26] The mean grain size (G.S.) of the prepared samples was estimated from the full-width at the half-maximum (FWHM) of the highest intense peak at (222) plane, by using Debye-Scherrer formula [29,30]. The calculated values of grain size are given in Table 1.…”
Section: The Xrd Analysismentioning
confidence: 69%
“…The existence of multiple diffraction peaks in the XRD pattern, confirms the polycrystalline nature of the CdO films [26] The mean grain size (G.S.) of the prepared samples was estimated from the full-width at the half-maximum (FWHM) of the highest intense peak at (222) plane, by using Debye-Scherrer formula [29,30]. The calculated values of grain size are given in Table 1.…”
Section: The Xrd Analysismentioning
confidence: 69%
“…Thus, the conditions of films obtaining were optimized. It was found that HgS films obtained in this way are not inferior in their characteristics to the same films, obtained by othermethods [9][10][11][12] and can be used in photosensitive applications.…”
mentioning
confidence: 63%
“…However, at high frequency, the dipoles will hardly be able to orient themselves. Therefore, the value of the dielectric constant decreases with increase in frequency . High permittivity at low frequency region is mainly due to the interfacial and space charge polarization .…”
Section: Resultsmentioning
confidence: 99%