Electrical Conductivity Measurement of DNA Double-Stranded Chains by “One-by-One” Cutting Method Using Atomic Force Microscopy

Inomata, Aoi; Shimomura, Takeshi; Heike, Seiji; Fujimori, Masaaki; Hashizume, Tomihiro; Ito, Kohzo

doi:10.1143/jpsj.75.074803

Cited by 12 publications

(35 citation statements)

References 22 publications

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“…Inomata et al [20] (II) for -DNA reported also pronounced strong temperature dependent conductance from 118 K to 265 K i.e. in a 147 K-wide temperature region.…”

Section: Comparison With Experiments and Discussionmentioning

confidence: 92%

“…The use of simple Arrhenius-type formulae by others seems to be inadequate to account for important features of the actual transport mechanism and related information. This is probably the reason of a lack of a simultaneous interpretation of the experimental findings [4,18,20] which show a similar behavior of the conductivity in DNA at high temperatures.…”

Section: Comparison With Experiments and Discussionmentioning

confidence: 98%

“…Given the very narrow temperature region of Kutnjak's high temperature data, the comparison of the theoretical results is made with respect to [4,18,20].…”

Section: Comparison With Experiments and Discussionmentioning

confidence: 99%

“…More recently, 2006, Inomata et al [20] measured the electrical I-V characteristics of -DNA in vacuum using fine electrodes. They performed conductivity measurements for several -DNA molecules and observed a relatively large divergence.…”

Section: (Ii) Dna As a Semiconductormentioning

confidence: 99%

“…More recently Inomata et al [20] measured the electrical current-voltage characteristics of -DNA in vacuum using fine electrodes. Each -DNA molecule had 48,502 base pairs corresponding to a length of 16.5 m. They diluted the -DNA solution with a TE buffer solution of the same composition.…”

Section: Charge Transfer Mechanism Of Dnamentioning

confidence: 99%

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DNA in the Material World: Electrical Properties and Nano-Applications

Triberis¹,

Dimakogianni

2009

NANOTEC

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Contradictory experimental findings and theoretical interpretations have spurred intense debate over the electrical properties of the DNA double helix. In the present review article the various factors responsible for these divergences are discussed. The enlightenment of this issue could improve long range chemistry of oxidative DNA damage and repair processes, monitoring protein-DNA interactions and possible applications in nano-electronic circuit technology. The update experimental situation concerning measurements of the electrical conductivity is given. The character of the carriers responsible for the electrical conductivity measured in DNA is investigated. A theoretical model for the temperature dependence of the electrical conductivity of DNA is presented, based on microscopic models and percolation theoretical arguments. The theoretical results, excluding or including correlation effects, are applied to recent experimental findings for DNA, considering it as a one dimensional molecular wire. The results indicate that correlation effects are probably responsible for large hopping distances in DNA samples. Other theoretical conductivity models proposed for the interpretation of the responsible transport mechanism are also reviewed. Some of the most known and pioneering works on DNA's nano-applications, future developments and perspectives along with current technological limitations and patents are presented and discussed.

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“…Inomata et al [20] (II) for -DNA reported also pronounced strong temperature dependent conductance from 118 K to 265 K i.e. in a 147 K-wide temperature region.…”

Section: Comparison With Experiments and Discussionmentioning

confidence: 92%

Section: Comparison With Experiments and Discussionmentioning

confidence: 98%

“…Given the very narrow temperature region of Kutnjak's high temperature data, the comparison of the theoretical results is made with respect to [4,18,20].…”

Section: Comparison With Experiments and Discussionmentioning

confidence: 99%

Section: (Ii) Dna As a Semiconductormentioning

confidence: 99%

Section: Charge Transfer Mechanism Of Dnamentioning

confidence: 99%

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DNA in the Material World: Electrical Properties and Nano-Applications

Triberis¹,

Dimakogianni

2009

NANOTEC

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Development and Characterization of High‐Performance Conductive Coatings on Cotton Yarn for Advanced Machine‐Sewn Electronic Textiles

Fathme,

Islam,

Liu

et al. 2024

Adv Materials Technologies

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This study explores the development and characterization of conductive coatings applied to cotton yarns for machine‐sewn electronic textiles. namely 100% pure undyed, fully bleached, and half bleached, are dip‐coated with two solutions: the conductive carbon paste (CCP) solution and the PEDOT:PSS (5 wt.%)/CCP (55.8 wt.%) solution. Each yarn is coated and dried three times, followed by cross‐linking with a 2% CaCl2 solution. Extensive testing, including electrochemical, SEM, tensile, FTIR, XPS, TGA, DTG, linear density, machine sewing, and wash durability, is performed. The half‐bleached yarn coated with CCP exhibits the highest conductivity (19.46 ± 0.240 Scm⁻¹) and density (65.33 ± 1.1 Tex), and the pure undyed yarn coated with PEDOT:PSS/CCP at 1.913 ± 0.007 Scm−1. Both coatings demonstrated durability, retaining conductivity, and strength after multiple washing cycles, with values of 18.70 ± 0.32 and 1.90 ± 0.007 Scm⁻¹ post‐wash. Thermal analysis (TGA and DSC) indicates improved stability, with Tm values reaching 273.66 and 280.38 °C for CCP and PEDOT/CCP coatings, respectively. FTIR and XPS confirmed strong chemical bonding, ensuring robust adhesion. These results suggest the feasibility of cost‐effective, bio‐compatible, and durable conductive yarns for advanced electronic textile applications.

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