2016
DOI: 10.1063/1.4972962
|View full text |Cite
|
Sign up to set email alerts
|

Electrical control of exchange bias via oxygen migration across CoO-ZnO nanocomposite barrier

Abstract: We proposed a nanocomposite barrier CoO-ZnO for magnetism manipulation in Co/CoO-ZnO/Ag heterojunctions. Both electrical control of magnetism and resistive switching were realized in this junction. An electrical tunable exchange bias of CoO1-v (v denotes O vacancies) on Co films was realized using voltages below 1 volt. The magnetism modulation associated with resistive switching can be attributed to the oxygen ions migration between the insulating CoO1-v layer and the semiconductive ZnO1-v layer, which can ca… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
12
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 11 publications
(12 citation statements)
references
References 37 publications
0
12
0
Order By: Relevance
“…Furthermore, lateral patterning of the EB and magnetic domain state by electrical means is demonstrated in a continuous EB film. This is an important advantage over the solid‐state ionic approaches for electrical EB control, which thus far require patterned elements . The voltage‐programming of magnetic domains in extended magnetic films provides the possibility of electrically controlled magnetophoretic devices that rely on laterally patterned artificial EB‐induced domain structures .…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Furthermore, lateral patterning of the EB and magnetic domain state by electrical means is demonstrated in a continuous EB film. This is an important advantage over the solid‐state ionic approaches for electrical EB control, which thus far require patterned elements . The voltage‐programming of magnetic domains in extended magnetic films provides the possibility of electrically controlled magnetophoretic devices that rely on laterally patterned artificial EB‐induced domain structures .…”
Section: Resultsmentioning
confidence: 99%
“…In this study, temperature instead of voltage was used as a control parameter. First attempts to voltage‐control EB via ionic mechanisms involve topographically patterned elements consisting of a cobalt layer in contact with a CoO x or HfO x AFM layer that exhibits resistive switching . The voltage‐dependent EB is interpreted based on a resistive switching mechanism, involving the formation and rupture of conducting filaments in the AFM and associated dynamic atomistic rearrangement of the AFM/FM interface.…”
Section: Introductionmentioning
confidence: 99%
“…Also visible is the reduced Co/O ratio at LRS. These features suggest that a part of oxygen ions in the CoO x layer drifts toward the Co layer and then is absorbed by electrochemical process, when applying positive voltage on the bottom electrode . The enhanced Co/O ratio in the CoO x layer at LRS, corresponding to the sputtering time of 20–25 min, also reflects the formation of oxygen vacancies, which constitutes the conductive filaments.…”
mentioning
confidence: 95%
“…Resistive random access memory (RRAM), which shows low and high resistance states (LRS and HRS) by the formation and rupture of conductive filaments in metal/insulator/metal sandwich structure, is supposed to be one of promising candidates for the next‐generation nonvolatile memories . Recently, the reversible control of magnetism in resistive switching (RS) structure with magnetic storage medium has been extensively explored . The spin transport is switched ON/OFF when the RRAM is at low/high resistance states .…”
mentioning
confidence: 99%
“…Among various non-volatile memristance materials, transition metal oxides such as NiO, Fe 2 O 3 and CoO have been widely studied due to their high resistance ratio between the high and the low resistance states, simple constituents and compatibility with complementary metal-oxide semiconductor [1921]. In addition, the RS in these materials is generally caused by the migration of ions [22,23]. This process is suitable for mimicking the internal dynamics of the synaptic weight change, which is also related to the migration of ions between pre- and post-synaptic neurons [24,25].…”
Section: Introductionmentioning
confidence: 99%