In this work, we present the experimental results on the effect of electric current-induced diffusion leading to change in ferromagnetic behavior of Co/Pd multilayer thin films. We applied high-density direct current to a Co/Pd multilayer specimen in ambient conditions. We observed an almost 8.8 times change in coercivity and improved squareness of the thin films using magneto-optic Kerr effect measurement. Magnetic force microscope studies further validate an increase in the coercivity for the current-treated thin films. We experimentally observe that this change cannot be attributed only to Joule heating due to electric current. We propose that the underlying mechanism for the observed behavior is electromigration induced diffusion along the grain boundaries and the thin film surface. Surface diffusion of O2 leads to formation of CoO resulting in the permanent coercivity change observed in this work. The composition of the specimens is Ta (1 nm)/ [Co (0.35 nm)/Pd (0.55 nm)]20.