Abstract:We present a new optical method for the electrical defect inspection for indium tin oxide (ITO) thin film on a glass substrate. The present method is based on the visualization of the microwave heating distribution around an electrical defect from the thermal stress distribution of the glass substrate of ITO-glass. By using a conventional polarized microscope with microwave irradiation (6 ∼ 15 GHz), we show that the present method provides a non-contact and non-destructive way to inspect an electrical defect o… Show more
“…The TEOIM is characterized as a hybrid technology capable of visualizing the distribution of microwave electric and magnetic near-fields using the polarized light microscopy method 32 , 33 . Figure 1 shows the experimental setup and sample measurement configuration.…”
A new practical imaging technique was presented for metamaterial characterization and investigation by visualizations of the magnetic microwave near-field (H-MWNF) distributions on a metamaterial's surface using the method of thermo-elastic optical indicator microscopy (TEOIM). ITO-based transparent and ceramic-based opaque metamaterial structures were designed for magnetic near-field visualization. Depending on the incident microwave field polarization, the TEOIM system allows the characterization of the metamaterial properties and microwave interaction behavior. The working principle of the periodic structures was investigated through numerical simulations, and the obtained results exhibited strong agreement when compared with experimental observations. Moreover, the visualization of the H-MWNF revealed the potential to characterize and evaluate the absorption and transmission properties effectively.
“…The TEOIM is characterized as a hybrid technology capable of visualizing the distribution of microwave electric and magnetic near-fields using the polarized light microscopy method 32 , 33 . Figure 1 shows the experimental setup and sample measurement configuration.…”
A new practical imaging technique was presented for metamaterial characterization and investigation by visualizations of the magnetic microwave near-field (H-MWNF) distributions on a metamaterial's surface using the method of thermo-elastic optical indicator microscopy (TEOIM). ITO-based transparent and ceramic-based opaque metamaterial structures were designed for magnetic near-field visualization. Depending on the incident microwave field polarization, the TEOIM system allows the characterization of the metamaterial properties and microwave interaction behavior. The working principle of the periodic structures was investigated through numerical simulations, and the obtained results exhibited strong agreement when compared with experimental observations. Moreover, the visualization of the H-MWNF revealed the potential to characterize and evaluate the absorption and transmission properties effectively.
“…The incident light directed to an OI through a non-polarized beam splitter and propagated to a glass substrate was reflected from the ITO layer of the indicator due to specular reflection. Finally, passing through an analyzer the intensity of light is registered by a CCD camera 4 , 26 . Figure 1 ( a ) Illustration of the visualization system.…”
Visualizations of the microwave electric and magnetic near-field distributions of radio-frequency (RF) filters were performed using the technique of thermoelastic optical indicator microscopy (TEOIM). New optical indicators based on periodic dielectric-metal structures were designed for electric field visualization. Depending on the structure orientation, such metasurface-based indicators allow separately visualization of the Ex and Ey components of the in-plane electric field. Numerical simulations were conducted to examine the working principle of the designed indicator structures, and the results were compared to the experimental, showing good agreement. In addition, the 3D visualization of the microwave near-field distribution was built, to show the field intensity and distribution dependencies on the distance from the RF filter.
“…Generally, OEDs structure is based on TCSs, such as FTO (fluorine-doped tin oxide) glass, ITO (indium tin oxide) glass, FTO PEN (polyethylene naphthalate) plastic, ITO PEN, FTO PET (polyethylene terephthalate), ITO PET, and so on [1][2][3][4][5][6][7][8][9]25]. TCS is constructed of substrate and transparent conductive film.…”
Section: Principlementioning
confidence: 99%
“…Transparent conductive substrates (TCSs) are characterized by their high transmission of visible light and simultaneously very high electrical DC (direct current) sheet conductivity [1][2][3][4][5][6]. TCSs can be applied as the transparent electrodes, which are the key component of optoelectronic devices (OEDs) for information (displays) and energy (photovoltaics, window glass and architectural) technologies [7][8][9]. External quantum efficiency (EQE) is an important physical quantity to evaluate the performance of OEDs.…”
Based on thin film optics (TFO) and finite element method (FEM), we have theoretically investigated improving external quantum efficiency (EQE) by anti-reflection (AR) films constructed from subwavelength nano multi-layers (NML) of low and high index materials, where the low and high index materials are MgF2 and Ta2O5, respectively. This kind of NML dielectric structures have the advantages of low-cost and flexible. Three kinds of substrates have been studied here, which are glass, polyethylene naphthalate (PEN), and polyethylene terephthalate (PET), respectively. TFO theory has been used to obtain the transmittance and reflectance, which agrees well with FEM results. For NML structure, TFO is more efficient than FEM in terms of calculation time and accuracy. The average AR effects (AAREs) are about 3.69%, 3.46% and 3.07% on glass substrate, about 6.15%, 5.56% and 5.02% on PEN substrate, and about 5.06%, 4.62% and 4.17% on PET substrate, for AR bands (ARBs) 350~800 nm, 350~1100 nm and 350~1500 nm, respectively. The results also reflect that wider AR bandwidth needs more NML layers. In practice, this kind of AR films can be widely applicable to enhance the EQE of the optoelectronic devices (OEDs). INDEX TERMS Anti-reflection, nano multi-layers, thin film optics, finite element method.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
