Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

Chang, Jow‐Ran; Chang‐Liao, Kuei‐Shu; Li, Chen-Chien

doi:10.1109/ted.2012.2219053

IEEE Trans. Electron Devices

2012

DOI: 10.1109/ted.2012.2219053

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Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

Jow‐Ran Chang

Kuei‐Shu Chang‐Liao

Chen-Chien Li

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Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

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References 18 publications

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