2006
DOI: 10.1016/j.ssi.2006.02.012
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Electrical degradation of porous and dense LSM/YSZ interface

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Cited by 55 publications
(34 citation statements)
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“…It is liable for the significant loss of voltages in SOFC mostly due to a great deal of polarization losses connected to reduction reaction [10,37,38]. The excessively used cathode material is strontium doped lanthanum manganite (La1−xSrxMnO3 (LSM)) in high temperature SOFC [10,12,[39][40][41][42][43][44][45][46]. It is associated to a manganite family of perovkites in which lanthanum is partially replaced with strontium.…”
Section: Cathodementioning
confidence: 99%
“…It is liable for the significant loss of voltages in SOFC mostly due to a great deal of polarization losses connected to reduction reaction [10,37,38]. The excessively used cathode material is strontium doped lanthanum manganite (La1−xSrxMnO3 (LSM)) in high temperature SOFC [10,12,[39][40][41][42][43][44][45][46]. It is associated to a manganite family of perovkites in which lanthanum is partially replaced with strontium.…”
Section: Cathodementioning
confidence: 99%
“…In fact, Brant et al [19] observed the formation of SZ at the interface between YSZ and porous LSM after annealing over 1200 ℃. According to van Roosmalen and Cordfunke [20], the formation of SZ from La 0.7 Sr 0.3 MnO 3 and ZrO 2 is estimated to start at 1247 ℃.…”
Section: Phases Of the Ysz Filmsmentioning
confidence: 99%
“…Its crystalline structure is influenced by temperature and oxygen partial pressure (Fergus et al, 2009;Singhal & Kendall, 2003).It is rhombohedral at room temperature while the undoped lanthanum manganites is orthorhombic (Fergus et al, 2009;Singhal & Kendall, 2003). LSM reacts with YSZ at temperatures above 1300 °C and unwanted electronic insulating phases like La 2 Zr 2 O 7 and SrZrO 3 are formed (Brant et al, 2006;Ralph et al, 2001 as cited in Wincewicz & Cooper, 2005). The amounts of these electronically insulating phases depend on the La/Sr ratio in the LSM (Sun et al, 2010).…”
Section: Wwwintechopencommentioning
confidence: 99%