1996
DOI: 10.1002/pssb.2221940218
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Electrical dislocation resistivity and anisotropic scattering in high‐purity copper single crystals

Abstract: The experimental dislocation rcsistivity (or the deviation from Matthiessen's rule (DMR)) at 4.2 and 77 K of sevcral single slip and multislip crystals was investigated. Additionally low-field Hall effect nieasurernents at 4.2 K using a dc SQUID picovoltmeter were pcrformed in order to study the anisotropy of electron-dislocation and electron-impurity scattering directly. It is shown that, oxygen annealing applied to increase tiic "elcctrical purity" of the crystals does not change the character of the scatter… Show more

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Cited by 4 publications
(2 citation statements)
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“…The electrical dislocation density measurement relies on the value of the specific dislocation resistivity R d and the modelling of the DMR contributions d ipd and d ip occuring in (4). If the mean free path of the conduction electrons (at 4.2 K) is larger than the typical fluctuation in dislocation density due to ªcellsº (size 0.5 to 1 mm) and ªcell wallsº (size one tenth of the cell size), the electrical resistivity does a proper averaging of the dislocation density.…”
Section: Dislocation Density From X-ray Bragg Profile Analysismentioning
confidence: 99%
“…The electrical dislocation density measurement relies on the value of the specific dislocation resistivity R d and the modelling of the DMR contributions d ipd and d ip occuring in (4). If the mean free path of the conduction electrons (at 4.2 K) is larger than the typical fluctuation in dislocation density due to ªcellsº (size 0.5 to 1 mm) and ªcell wallsº (size one tenth of the cell size), the electrical resistivity does a proper averaging of the dislocation density.…”
Section: Dislocation Density From X-ray Bragg Profile Analysismentioning
confidence: 99%
“…That is, knowing the elastic coefficients of electrical conductivity of the material under examination, it is possible to infer the residual stress levels from a measurement of electrical conductivity of the material. Cold work evaluation is possible owing to the decrease in electrical conductivity due to dislocations concentration [13,14]. However, in practice, the change in apparent EC conductivity is due in part to elastic strains (residual stress), and in part to plastic strains (cold work) [15], which complicates the interpretation of EC results.…”
Section: Introductionmentioning
confidence: 98%