1998
DOI: 10.1109/23.736516
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Electrical performance and radiation sensitivity of stacked PMOS dosimeters under bulkbias control

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Cited by 29 publications
(12 citation statements)
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“…Moreover, the sensitivity decreases with increasing dose. Therefore, these devices are used when regular measurements of doses absorbed over long periods of time are required [10], [11].…”
Section: T He Radiation Environment Encountered In the Largementioning
confidence: 99%
“…Moreover, the sensitivity decreases with increasing dose. Therefore, these devices are used when regular measurements of doses absorbed over long periods of time are required [10], [11].…”
Section: T He Radiation Environment Encountered In the Largementioning
confidence: 99%
“…, the peak value of the signal is given by (3) and it is directly proportional to the dose as long as the stimulation flux remains constant. Let us consider now the integrated OSL signal.…”
Section: A Influence Of the Stimulation Flux On The Osl Signalmentioning
confidence: 99%
“…Acting as a fully passive detector with no power consumption during the irradiation, the OSL sensor is completely reset after a four-second reading process. Complementary to RADFET's [3], [4] that measure the dose integrated over the duration of the mission, the OSL makes it possible to evaluate the dose deposited orbit by orbit. A major application of the OSL sensor is the evaluation of the dose received by spacecrafts flying on low earth orbits (LEO).…”
Section: Introductionmentioning
confidence: 99%
“…The RADFETs disadvantages are in need for calibration in different radiation fields [8], [9]. RADFETs have been proposed in different applications to measure doses of miligray in personal dosimetry [10], [11], from centigrays to some grays in medical applications [12]- [18] and up to thousands of grays in space applications [8], [19]- [21]. Due to their switching speed, simplified input drive requirements, low noise and negligible thermal instabilities, power Vertical Double-Diffused MOSFETs (VDMOSFETs) are a good choice for applications involving radiation environments [22].…”
Section: Introductionmentioning
confidence: 99%