1993
DOI: 10.1002/crat.2170280221
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Electrical Properties of CuInSe2 Single Crystals Implanted with Xenon

Abstract: Both p-type and n-type CuInSe, single crystals were implanted with 40 keV 13'Xe+ ions up to doses of 5 . 1OI6 cm-'. Implanted layers on p-type substrates showed an initial increase of the resistivity followed by a continuous decrease of the resistivity at higher doses. Implanted layers on n-type substrates gave also an increase of the resistivity at lower doses, but at higher doses a conductivity type conversion from n-type to p-type took place, followed by a decrease of the resistivity. To explain the experim… Show more

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Cited by 13 publications
(3 citation statements)
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“…The third change is the new level state detected at low dose having the ionization energy of 223 meV. It coincides well with the one reported by Tomlinson and co-workers [9] and attributed to the acceptor state Cu In .…”
Section: Resultssupporting
confidence: 90%
See 1 more Smart Citation
“…The third change is the new level state detected at low dose having the ionization energy of 223 meV. It coincides well with the one reported by Tomlinson and co-workers [9] and attributed to the acceptor state Cu In .…”
Section: Resultssupporting
confidence: 90%
“…• Region 2 (0.92 ≤ hν ≤ 1.02 eV): the fundamental edge region which shows clearly the direct band to band transition of CuInSe 2 . The maximum coincides well with the reported value of the gap energy for CuInSe 2 single crystals [9], E g = 1.01 eV, indicated by an arrow in the gures. The xenon implantation process is seen to aect the shoulder which is close to the maximum of the edge.…”
Section: Resultssupporting
confidence: 88%
“…38 An increase in resistivity has also been reported after ion implantation of Xe into CuInSe 2 single crystals. 39 FIG. 6.…”
Section: E Possible Defects Associated With W-linesmentioning
confidence: 99%