1979
DOI: 10.1088/0022-3727/12/10/015
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Electrical properties of evaporated CdSe films

Abstract: The electrical properties, viz resistivity and I-V characteristics, of evaporated CdSe films sandwiched between two Al electrodes have been studied in situ at 30 degrees C and at 8*10-6 Torr within the thickness range of 2400-2500 AA as function of substrate temperature (50-150 degrees C). The observed change in resistivity in I-V characteristics could be explained by stoichiometric changes of the film material and film disorder of thermally evaporated films. Space-charge-limited current conduction was observe… Show more

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Cited by 23 publications
(9 citation statements)
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“…As already demonstrated, in this low voltage regime the back-to-back Schottky model (eq ) predicts the current as a function of E app . Slopes larger than 2.0 are observed for all devices at E app > 5 V. As previously described, slopes exceeding 2.0 signal that the SCLC current is augmented by other transport mechanisms such as P–F emission or Schottky emission.…”
Section: Resultssupporting
confidence: 74%
“…As already demonstrated, in this low voltage regime the back-to-back Schottky model (eq ) predicts the current as a function of E app . Slopes larger than 2.0 are observed for all devices at E app > 5 V. As previously described, slopes exceeding 2.0 signal that the SCLC current is augmented by other transport mechanisms such as P–F emission or Schottky emission.…”
Section: Resultssupporting
confidence: 74%
“…Current versus voltage (| I |− V ) curves were approximately symmetrical about E app = 0 V for all three of the devices explored in this study (Figure a). The pronounced curvature of these | I |− V curves is a characteristic of M–S–M devices that incorporate Schottky barriers at both contacts, including those prepared from polycrystalline CdSe films, and has also been reported for M–S–M structures that incorporate semiconducting nanowires. , The ohmic resistance, R , of the nc -CdSe nanowires in these two devices cannot be accurately measured from these I–V curves, but a minimum value for R can be obtained from d V /d I evaluated at high E app values . Using this estimate, the electrical resistance of the nc -CdSe nanowires annealed at 300 °C for 4 h is ∼20–30 times higher than those annealed at 450 °C for 1 h. The lower resistance of the nc -CdSe nanowires prepared at 450 °C could be a manifestation of the larger grain diameter in the nc -CdSe (Figure b) or a higher dopant density in these samples, and the relative weighting of these two contributions cannot be determined from our data.…”
Section: Resultsmentioning
confidence: 90%
“…(2) For the in situ heating experiment, the thermal evaporation temperature (ca. 550 °C) of CdSe in TEM significantly dropped in contrast to that of the conventional thermal physical vapor deposition, which needs 725 °C (8 × 10 –6 Torr) to achieve significant vapor phase of CdSe 39. The decrease in evaporation temperature for nanosized CdSe can be explained by the size effect of the nanoparticles, i.e.…”
Section: Discussionmentioning
confidence: 96%