2017
DOI: 10.25073/2588-1124/vnumap.4091
|View full text |Cite
|
Sign up to set email alerts
|

Electrical Properties of Nb-Doped TiO2 Thin Films Deposited by Co-sputtering Process

Abstract: Nb-doped TiO 2 thin films were fabricated by co-sputtering of TiO 2 doped 6%wt by Nb 2 O 5 and Nb targets. The anatase polycrystalline thin films were obtained by post-annealing at 350 o C in vacuum atmosphere. The electrical properties of the film were determined by the Hall method using standard clove-leaf geometry. The results indicated that: when the Nb concentration increases followed by the numbers of electrons increase from 4×10 18 cm -3 to 2.4×10 20 cm -3 . Meanwhile the resistivity fall down from 10 t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 17 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?