2015
DOI: 10.1007/s11664-015-4262-y
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Electrical Properties of PVP–SiO2–TMSPM Hybrid Thin Films as OFET Gate Dielectric

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Cited by 19 publications
(2 citation statements)
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“…They exhibit a strong hysteresis, for negative applied voltage, while the corresponding phenomenon for positive applied voltage is weaker. This is unlike the usual symmetrical hysteresis, such as for ferroelectric materials, but it can be found in cases of hybrid materials with crystalline/amorphous phases films, leading to a polarity dependence in the leakage currents [ 49 , 50 ]. The branches of the negative hysteresis connect around −3 V and the coercive voltage is around −2 V. According to the curve shape, it is assumed that two different conduction mechanisms or respective defect types contribute to the conduction characteristics.…”
Section: Resultsmentioning
confidence: 99%
“…They exhibit a strong hysteresis, for negative applied voltage, while the corresponding phenomenon for positive applied voltage is weaker. This is unlike the usual symmetrical hysteresis, such as for ferroelectric materials, but it can be found in cases of hybrid materials with crystalline/amorphous phases films, leading to a polarity dependence in the leakage currents [ 49 , 50 ]. The branches of the negative hysteresis connect around −3 V and the coercive voltage is around −2 V. According to the curve shape, it is assumed that two different conduction mechanisms or respective defect types contribute to the conduction characteristics.…”
Section: Resultsmentioning
confidence: 99%
“…The material exhibited favorable interfacial characteristics for the growth of a pentacene layer, and thus a relatively high mobility of 0.50 cm 2 V −1 s −1 was displayed with low hysteresis. Shahbazi et al 228 used the sol−gel method with different amounts of 3-(trimethoxysilyl)propyl methacrylate (TMSPM) as the coupling agent to produce a PVP-SiO 2 -TMSPM hybrid nanocomposite. The in situ chemical bond formation between the filler and matrix led to an enhanced compatibility.…”
Section: Polymer Nanocomposite Gate Dielectricsmentioning
confidence: 99%