2015
DOI: 10.1016/j.solmat.2014.10.009
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Electrical properties of sprayed Cu2ZnSnS4 thin films and its relation with secondary phase formation and solar cell performance

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Cited by 65 publications
(25 citation statements)
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“…The localization length shows the opposite behavior, increasing as the Cu/Sn ratio increases, with values ranging from 2.9 to 7.1 nm. These values are similar to the ones observed in CZTS thin films fabricated by means of the pneumatic spray pyrolysis method [25], in samples prepared by the thermal sulfurization process of Cu/Zn/Sn metallic stacks [13], [24], [38], or in samples synthesized from powders of Cu, Zn, Sn, and S [39]. These behaviors can be explained taking into account the multivalency of Sn as a function of the Cu/Sn ratio, although they may also be influenced by other composition-related effects such as grain growth.…”
Section: Coulomb Interaction a Soft Gap Would Open In The Dos And Tsupporting
confidence: 87%
See 1 more Smart Citation
“…The localization length shows the opposite behavior, increasing as the Cu/Sn ratio increases, with values ranging from 2.9 to 7.1 nm. These values are similar to the ones observed in CZTS thin films fabricated by means of the pneumatic spray pyrolysis method [25], in samples prepared by the thermal sulfurization process of Cu/Zn/Sn metallic stacks [13], [24], [38], or in samples synthesized from powders of Cu, Zn, Sn, and S [39]. These behaviors can be explained taking into account the multivalency of Sn as a function of the Cu/Sn ratio, although they may also be influenced by other composition-related effects such as grain growth.…”
Section: Coulomb Interaction a Soft Gap Would Open In The Dos And Tsupporting
confidence: 87%
“…Polycrystalline CZTS tends to grow in columnar grains [23]. Since planar conductivity measurements were performed (instead of throughthickness conductivity), the results would suggest that the main mechanism that affects the conductivity is the thermal emission of carriers over the GBB, as it was assumed too in [24] and [25].…”
Section: Resultsmentioning
confidence: 99%
“…В модели пленок из поликристаллических зерен огра-ничения подвижности носителей заряда µ барьерами границ зерен E b пропорциональны уменьшению ими электропроводности σ (12). Поскольку при пневма-тическом спрей-пиролизе размеры зерен в пленках CZTS и CFTS отличаются незначительно и составля-ют L ∼ 200 nm [11,20,40], значения подвижности ды-рок, близкие µ p ∼ 3−10 cm 2 /(V · s) [11] для CFTS и µ p ∼ 5−30 cm 2 /(V · s) для CZTS [42], то основной при-чиной различия в электропроводности исследуемых пле-нок являются электрические свойства самих кристал-литов, которые определяются концентрацией дырок p 0 . При одинаковых условиях изготовления пленок CZTS и CFTS их электропроводность определяется прежде всего концентрацией основных носителей заряда в кристал-литах.…”
Section: результаты и их обсуждение электрические свойстваunclassified
“…Определенная по методике исследования оптических спектров поглощения с энергией, близкой к ширине запрещенной зоны E g , неоднократно использованная для нахождения параметров тонких пленок различных полупроводников [43,44] с границами зерен, в том числе и для пленок CZTS [42], эффективная концентрация дырок в пленках CMTS составляет p 0 = 3.16 · 10 18 cm −3 . Рассчитанная с использованием диэлектрической про-ницаемости соединения CZTS ε r = 6.7 [45] и учетом диэлектрической проницаемости вакуума ε 0 толщина границ зерен в пленках CZTS по выражению [46] …”
Section: результаты и их обсуждение электрические свойстваunclassified
“…To match accurately with experimental data in the long wavelength region (energy values lower than CZTS band gap), experimental CZTS absorption coefficient was considered [15,16]. Once the EQE T (k) is calculated, by means of the AM1.5 solar spectrum F(k), the photocurrent is determined by integration:…”
Section: Czts/cds Solar Cell J-v Characteristicsmentioning
confidence: 99%