2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 2018
DOI: 10.1109/ceidp.2018.8544759
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Electrical Tree Growth Under Very Low Frequency (VLF) Voltage Excitation

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Cited by 3 publications
(6 citation statements)
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“…The correlation dimension parameter D 2 has been used to characterize the geometrical structure of electrical trees [4]. Different behavior of D 2 with the progression of electrical trees have been reported [11], [20], [35]. The trend found in this work under VLF excitation, see Fig.…”
Section: Correlation Dimensionmentioning
confidence: 53%
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“…The correlation dimension parameter D 2 has been used to characterize the geometrical structure of electrical trees [4]. Different behavior of D 2 with the progression of electrical trees have been reported [11], [20], [35]. The trend found in this work under VLF excitation, see Fig.…”
Section: Correlation Dimensionmentioning
confidence: 53%
“…However, this was not a limitation, due to the use of enough windows or intervals for the study of the parameters' evolution during tree growth. Thus, several intervals of analysis were selected from the entire time series following a similar methodology previously used [11], [36]. Each interval was selected to have at least 10,000 PD events and at least 1,000 and 10 seconds for 0.1 and 50 Hz experiments respectively.…”
Section: B Selection Of Data For Analysismentioning
confidence: 99%
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