2018
DOI: 10.1002/advs.201801370
|View full text |Cite
|
Sign up to set email alerts
|

Electrically Robust Single‐Crystalline WTe2 Nanobelts for Nanoscale Electrical Interconnects

Abstract: As the elements of integrated circuits are downsized to the nanoscale, the current Cu‐based interconnects are facing limitations due to increased resistivity and decreased current‐carrying capacity because of scaling. Here, the bottom‐up synthesis of single‐crystalline WTe2 nanobelts and low‐ and high‐field electrical characterization of nanoscale interconnect test structures in various ambient conditions are reported. Unlike exfoliated flakes obtained by the top‐down approach, the bottom‐up growth mode of WTe… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
37
1
1

Year Published

2020
2020
2023
2023

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 22 publications
(41 citation statements)
references
References 47 publications
2
37
1
1
Order By: Relevance
“…This low resistivity is expected due to the semimetallic nature of WTe 2 . Interestingly, this resistivity matches almost exactly the values measured by Song et al [23] in their paper on the potential use of single-crystal WTe 2 nanobelts as electrical interconnects in nanoelectronics. Their synthesis method requires the deposition of films of W and Cu that are then exposed to Te vapour.…”
Section: Electrical Characterisationsupporting
confidence: 88%
See 3 more Smart Citations
“…This low resistivity is expected due to the semimetallic nature of WTe 2 . Interestingly, this resistivity matches almost exactly the values measured by Song et al [23] in their paper on the potential use of single-crystal WTe 2 nanobelts as electrical interconnects in nanoelectronics. Their synthesis method requires the deposition of films of W and Cu that are then exposed to Te vapour.…”
Section: Electrical Characterisationsupporting
confidence: 88%
“…Works on thicker samples of WTe 2 generally show increasing resistivity as the temperature is increased. The magnitude of this effect is reported as being between ~ 5% and ~ 500% change over a similar temperature window to that examined in this work [23,31,51,75]. It is possible that effects such as the formation of a potential barrier at the contacts due to surface oxidation may also be influencing results seen in this and other works.…”
Section: Electrical Characterisationsupporting
confidence: 69%
See 2 more Smart Citations
“…The Pd/Cl-SnSe2 junction exhibits a low contact resistance of ~0.164 kΩ μm at VGS = 0 V, which guarantees highly efficient carrier injection at the 3D metal/2D metal junction. Notably, this contact resistance value is lower than values obtained using a phase-engineered (0.2-0.3 kΩ µm), 23 3D metal/graphene (2-10 2 kΩ μm), 24,25 and 3D metal/2D 1T′-WTe2 contacts (0.4-1.03 kΩ μm), 26,27 which shows the great potential of our Cl-SnSe2 as a 2D metal contact. The inset in Fig.…”
Section: Electrical Characterization Of Cl-snsecontrasting
confidence: 54%