Cleo: 2015 2015
DOI: 10.1364/cleo_si.2015.sf1g.4
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Electro-optic effect in silicon nitride

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Cited by 9 publications
(8 citation statements)
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“…It was further shown in [53] that the nonlinearity can be activated by the formation of Si-Br bonds during an HBr dry etching process, and we predict a similar effect for SiN bonds. Finally, the fact that χ (2) has been observed in SiN waveguides that are naturally strained [19][20][21][22][23] also serves to confirm our explication.…”
Section: Discussionsupporting
confidence: 78%
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“…It was further shown in [53] that the nonlinearity can be activated by the formation of Si-Br bonds during an HBr dry etching process, and we predict a similar effect for SiN bonds. Finally, the fact that χ (2) has been observed in SiN waveguides that are naturally strained [19][20][21][22][23] also serves to confirm our explication.…”
Section: Discussionsupporting
confidence: 78%
“…a relatively small degree of "tetragon poling", the values of SGI-χ (2) reported in the literature will result. Note that one of the possible mechanisms for a non-zero second order susceptibility in SiN invoked in the literature [21][22][23] has been the re-orientation of Si clusters with broken inversion symmetry [51], but no quantitative estimate of the effect had been given. Since each Si-N bond (or tetragon) already carries a large nonlinear polarizability that leads to a large χ (2) with a strain-gradient induced alignment, , it appears to us that it is entirely unnecessary to invoke Si clusters whose nonlinear polarizability is inherently small (since the bonds inside are homopolar).…”
Section: Sinmentioning
confidence: 99%
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“…This material system is CMOS-compatible, thus, the device can be integrated on a Si-photonics platform, enabling low-power dense wave division multiplexing (DWDM) solutions. An additional interesting feature of this material system is the higher electro-optic coefficient of compared to silicon which leads to the demonstration of electro-optical effects [41] enhanced by placing a thin-layer of lithium niobate as mentioned in Subsection 3.4 . For fabrication considerations, a process was investigated and suggested for this model.…”
Section: Design Analysis and Simulation Of The Electromagnetic Problemmentioning
confidence: 99%
“…, aumentando a magnitude da susceptibilidade χ(2) em uma ordem de grandeza[67].Além disso, a simetria do material também pode ser perturbada aplicando uma pressão mecânica (gradiente de pressão) sobre o meio. O efeito foi observado em um guia de onda de silício, devido à tensão causada pela deposição de nitreto de silício sobre o guia de onda[68].…”
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