2006
DOI: 10.1016/j.optlastec.2004.10.009
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Electro-optic mapping systems of electric-field using CW laser diodes

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Cited by 4 publications
(3 citation statements)
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“…An enlarged view of the EO probe tip and its detailed critical dimensions are illustrated in figure 1(b). Its large EO coefficient for the tangential (transverse) electric field in fact allows it to perform well in both the dc bias and ac highfrequency voltage measurements, as evidenced in our previous measurements on high-frequency electric field distributions [9]. Since the EO probing system for ac measurement has been described well in our previous work, only properties of the dc bias measurement will be detailed in this section.…”
Section: The New Electro-optic Probing Systemmentioning
confidence: 82%
“…An enlarged view of the EO probe tip and its detailed critical dimensions are illustrated in figure 1(b). Its large EO coefficient for the tangential (transverse) electric field in fact allows it to perform well in both the dc bias and ac highfrequency voltage measurements, as evidenced in our previous measurements on high-frequency electric field distributions [9]. Since the EO probing system for ac measurement has been described well in our previous work, only properties of the dc bias measurement will be detailed in this section.…”
Section: The New Electro-optic Probing Systemmentioning
confidence: 82%
“…For high frequency signals, they can be detected by replacing the above devices with high frequency versions or down converted to audio frequency by the EO heterodyne technique proposed by our previous work. 12 Figure 5͑a͒ shows the sensed waveform of the real-time signal on the DUT metal electrodes when the closed-loop control system was turned on. For this result, the amplifier gain was set to 200.…”
Section: Experimental Setup and Resultsmentioning
confidence: 99%
“…In practical respects, the reflective scheme is generally preferred, with a sensor tip as the terminal of the optical sensor and the light being modulated at the sensor terminal when it is exposed to an electric field. The reflected beams to be detected are efficiently returned from the sensor using a number of common methods: a mirror [ 7 9 , 13 15 ]; total internal reflection [ 11 13 ]; highly reflective surfaces from the device under tests [ 16 ]; or through fabrication of a resonator on the sensor plate [ 10 ].…”
Section: Design Methods Of Fiber-coupled Eo Probesmentioning
confidence: 99%