2020
DOI: 10.1039/d0na00168f
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Electro-thermal transport in disordered nanostructures: a modeling perspective

Abstract: We review here how molecular dynamics and quantum transport can be combined to shed light on the performance of, for example, conductive bridging random access memories, and we show that electro-thermal effects play a critical role.

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Cited by 9 publications
(4 citation statements)
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“…The coupling between our quantum transport solver and CP2K is outlined in detail in ref. 39 . The Hamiltonian and overlap matrices required by NEGF were exported from CP2K.…”
Section: Quantum Transport Simulation Methodsmentioning
confidence: 99%
“…The coupling between our quantum transport solver and CP2K is outlined in detail in ref. 39 . The Hamiltonian and overlap matrices required by NEGF were exported from CP2K.…”
Section: Quantum Transport Simulation Methodsmentioning
confidence: 99%
“…To generate H cp2k and S cp2k , the orbitals for all the atoms in the device are described by a short-range SZV basis set, which was found sufficient to capture trends in the final transmission (see ref 69). Using a higher number of basis functions per orbital would lead to more accurate results for a larger transport energy window, but is computationally unfeasible for the system sizes considered here.…”
Section: Methodsmentioning
confidence: 99%
“…Coupled electron-phonon transport with atomistic NEGF was first achieved for molecular bridge junctions using an empirical basis set for both particle types [32]. A fully ab initio treatment of both electrons and phonons was proposed later for 3-D metal-oxide-metal heterostructures [33]. The same has not yet been done for coupled electron-photon transport.…”
Section: Coupled Fermion-boson Transportmentioning
confidence: 99%
“…The search for reliable memristive material stacks has motivated the application of the atomistic DFT+NEGF method to other non-volatile resistive switching systems as well. For example, a recent work by Ducry et al [33] coupled electron and phonon transport at the ab initio level to determine the influence of Joule heating on the performance of Cu-SiO 2 -W CBRAM cells.…”
Section: B Memory Cellsmentioning
confidence: 99%