“…The resistivity of an electroactive SMC has already been reported to vary with filler content [18,19] or temperature [2,8], among others. There are, however, very few reports on the strain dependence of ρ e [5,[19][20][21]. In addition, the monitoring of the electrical properties of the SMC during a full shape memory cycle has, to our knowledge, not yet been covered in spite of its crucial importance for accurately and efficiently controlling the resistive heating of the SMC.…”