2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) 2015
DOI: 10.1109/therminic.2015.7389607
|View full text |Cite
|
Sign up to set email alerts
|

Electro-thermo-mechanical modelling and analysis of the press pack diode in power electronics

Abstract: This paper details a finite element modelling approach of the press pack assembly process for a diode in a power electronic module. Molybdenum and aluminum graphite have been investigated as suitable materials for the contact pad. Contact analysis has been used to model the pressurized thermal interface in order to extract both the stress and temperature distribution in the diode. Average temperature and von Mises stress on the chip for a combination of clamping pressure, load current and contact pad material … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2016
2016
2022
2022

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 13 publications
(2 citation statements)
references
References 13 publications
0
2
0
Order By: Relevance
“…The development of electrothermal models is an area of increasing interest in power electronics. This type of models enables the investigation of the loss distribution within the devices comprising a converter and the analysis of the resulting junction temperature excursion [12,20,21], as well as passive components [22]. As a result of the thermomechanical stresses, the power electronic components degrade, resulting in a reduced lifetime [23,24].…”
Section: Development Of the Simulation Modelmentioning
confidence: 99%
“…The development of electrothermal models is an area of increasing interest in power electronics. This type of models enables the investigation of the loss distribution within the devices comprising a converter and the analysis of the resulting junction temperature excursion [12,20,21], as well as passive components [22]. As a result of the thermomechanical stresses, the power electronic components degrade, resulting in a reduced lifetime [23,24].…”
Section: Development Of the Simulation Modelmentioning
confidence: 99%
“…Analytical models widely cited in the literature [10]- [12] were used to estimate the thermal and electrical contact resistances. A direct multi-physics coupling analysis involving electro-thermo-mechanical interactions which approximate the joule heating and the resulting thermally induced deformation and stresses on structure on the press-pack module was numerically simulated in the finite element software.…”
Section: Finite Element Analysis Of the Performance Of A Siliconmentioning
confidence: 99%