To cite this version:Mamadou Dieng, Jacques Simonet, Viatcheslav Jouikov. Silylation of carbon surfaces through the electrochemical reduction of 2,2'-bipy×R 3 SiCl adducts. Electrochemistry Communications, Elsevier, 2015, 53, pp.33-36. <10.1016/j.elecom.2015.02.008>. A C C E P T E D M A N U S C R I P T
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AbstractElectrochemical reduction of complexes of monochlorosilanes with redox-active ligands such as 2,2'-bipy occurs in one-electron fashion at moderately negative potentials, E @ -1 V vs SCE (in CH 3 CN/0.1 M Bu 4 NBF 4 ), leading to silyl radicals. These radicals, trapped with a-phenyl-N-tbutyl-nitrone and characterized as spin-adducts by ESR spectroscopy, add to carbon interfaces (glassy carbon, graphite) providing an efficient method of covalent Si-C silylation of such surfaces. Silylated interfaces were studied by voltammetry, EIS, SEM, EDS, and FTIR spectroscopy.