The effect of a simultaneous additions of tungsten and niobium on the anodic passivity of the surface films of the sputter−deposited amorphous/nanocrystalline W-xNb alloys was studied using corrosion tests, electrochemical measurements and X-ray photoelectron spectroscopic (XPS) analyses. The formation of spontaneous passive film on the alloys, which is composed of double oxyhydroxides of W ox and Nb 5+ ions, is responsible for their higher corrosion resistance than those of the alloy-constituting elements in 12 M HCl solution open to air at 30°C. The quantitative surface analysis by XPS clarifies that the improved anodic passivity of the alloys than those of alloy-constituting elements is based on the formation of new double oxyhydroxide anodic films composed of W 6+ and Nb
5+The passivity of metals or alloys is a subject of significant research in the fields of corrosion science and engineering. The mechanisms of passive film formation and the nature of the passive films can be understood by modern electrochemical theories with the aid of potentiostatic or/and galvanostatic polarization measurements. The change in the current density as a function of polarization potential (that is, deviation of potentials away from equilibrium) represented in the polarization diagrams, and several processes related to corrosion and passivation can be easily understood with the help of the polarization diagrams of the alloys or metals. It must be remembered that experiments have to be performed by controlling the potential and measuring the current (that is, either by ions. These anodic passive films have higher protectiveness and stability than those of the anodic passive oxyhydroxide films of alloy-constituting elements, that is, oxyhydroxides of hexavalent tungsten and pentavalent niobium after potentiostatic polarization for 1 h in 12 M HCl at 30°C.