Electrochemical Characterization of Passive Films on Ni-Based Alloys in Acidic and Neutral Solutions

Kim, Whee Sung; Tsuchiya, Hiroaki; Fujimoto, Shinji

doi:10.2320/matertrans.m2014384

Cited by 7 publications

(4 citation statements)

References 30 publications

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“…35 It is worth mentioning that in this potential range, Ni remains in a passive state. 36,37 Similar polarization curves were obtained for the ternary Ni-xCr-8Fe alloys (x = 14, 22, 30 wt%), as presented in Fig. 3b.…”

Section: Obtaining Way Parameterssupporting

confidence: 78%

Role of Alloying Elements in Passive and Transpassive Behavior of Ni–Cr-Based Alloys in Borate Buffer Solution

Zhang

Ter‐Ovanessian

Marcelin

et al. 2021

J. Electrochem. Soc.

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The role of the alloy composition of binary Ni–xCr alloys (x = 16, 20, 24, 28 wt.%) and ternary Ni–xCr–8Fe alloys (x = 14, 22, 30 wt.%) in borate buffer solution on the passive and transpassive behavior was investigated using successive electrochemical impedance measurements. These measurements supplement conventional polarization curves by enabling monitoring of the evolution of the electrochemical parameters extracted from impedance diagrams (thickness, resistivity at interfaces, etc) during the polarization. The polarization curves and evolution of the impedance parameters revealed that the Cr content and addition of Fe did not significantly affect the behavior of the alloys within the passive potential domain but directly affected the transpassivation process at higher potentials. For the Ni–xCr alloys, a higher Cr content resulted in a higher current-density peak for the transpassivation–second passivation processes. Conversely, the addition of Fe reduced or even prevented the appearance of this current-density peak. X-ray photoelectron spectroscopy analysis provided complementary information to help explain the role of alloying elements in the passivation (and secondary oxidation) mechanisms of Ni-based alloys in borate buffer solution.

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Section: Obtaining Way Parameterssupporting

confidence: 78%

Role of Alloying Elements in Passive and Transpassive Behavior of Ni–Cr-Based Alloys in Borate Buffer Solution

Zhang

Ter‐Ovanessian

Marcelin

et al. 2021

J. Electrochem. Soc.

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“…This approach is similar to the duplex-structure analysis described in our previous studies on passive films of Fe-Cr alloys, Ni-Cr alloys and Cr. 11,13,23,28,29 The E g s of the passive film on Cr were estimated as approximately 2.5 and 3.6 eV. Referring to E g reported for Cr oxide and hydroxide, 13,30 it is found that the E g s of 2.5 and 3.6 eV obtained from the photoelectrochemical response were attributed to the outer Cr(OH) 3 and inner Cr 2 O 3 layers, respectively.…”

Section: Hv Imentioning

confidence: 89%

“…[3][4][5] Passive films on Fe-Cr, Ni-Cr and Co-Cr-Mo alloys consist of oxides and hydroxides, including large amounts of Cr. [6][7][8][9][10][11] Passive films on Ti 12 and Cr 13 are known to exhibit semiconductive behavior. Ti oxides are widely used as functional materials in light-energy conversion devices and their semiconductor behavior has been investigated in various studies, including the pioneering work of Bard.…”

mentioning

confidence: 99%

“…13,23 Kim et al reported that the photocurrent generated on passive films of Ni-Cr alloys depended on the Cr content inside the films. 11 In electrochemical impedance spectroscopy, which is commonly used to determine the type of semiconductor, the Mott-Schottky plots did not necessarily show a straight line due to the duplex structure of passive films on the Cr-containing alloy. 23,24 Santamaria et al considered passive films formed on type 304L, 316L and duplex stainless steels in various solutions with different pHs.…”

mentioning

confidence: 99%

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Electronic Structures of Passive Film Formed on Ti and Cr in a Phosphate Buffer Solution of pH 7

Kim,

Tsuchiya,

Manaka

et al. 2024

J. Electrochem. Soc.

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The electronic structures, including the semiconductive properties, of the passive films formed on Cr and Ti in a phosphate buffer solution of pH 7 were evaluated using photoelectrochemical response, electrochemical impedance spectroscopy and X-ray photoelectron spectroscopy (XPS). Based on the results, electronic band structure models of the passive films were proposed: the passive films on Cr consisted of an inner p-type oxide layer with a band gap energy, Eg, of 3.6 eV and an outer p-type hydroxide layer with Eg of 2.5 eV whereas those on Ti consisted of an inner n-type oxide layer with Eg of 3.2 eV and an outer n-type hydroxide layer with Eg of 2.5 eV. The type of semiconductor evaluated for the oxide and hydroxide layers was strongly supported by valence-band XPS, which can provide the energy difference between the Fermi energy of the underlying metal and the highest energy of the valence bands of the oxide and hydroxide layers in the passive films.

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Characterization of oxide films formed on Alloy 600 and Alloy 690 in simulated PWR primary water by using hard X-ray photoelectron spectroscopy

Fujimoto

Kim

Sato

et al. 2015

J Solid State Electrochem

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Electrochemical Characterization of Passive Films on Ni-Based Alloys in Acidic and Neutral Solutions

Cited by 7 publications

References 30 publications

Role of Alloying Elements in Passive and Transpassive Behavior of Ni–Cr-Based Alloys in Borate Buffer Solution

Role of Alloying Elements in Passive and Transpassive Behavior of Ni–Cr-Based Alloys in Borate Buffer Solution

Electronic Structures of Passive Film Formed on Ti and Cr in a Phosphate Buffer Solution of pH 7

Characterization of oxide films formed on Alloy 600 and Alloy 690 in simulated PWR primary water by using hard X-ray photoelectron spectroscopy

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