2002
DOI: 10.1088/0960-1317/12/2/307
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Electrochemical characterization of Si in tetra-methyl ammonium hydroxide (TMAH) and TMAH:Triton-X-100 solutions under white light effects

Abstract: An experimental study of the electrochemical characteristics of the silicon/tetra-methyl ammonium hydroxide (TMAH) junction under dark and white light conditions are investigated for both n- and p-type Si. The presence of Triton-X-100 (TX100) in the TMAH solution under white light conditions is also studied. Cyclic voltammetry (CV) and ex situ atomic force microscopy (AFM) are employed to study the white light effects on the etching characteristics of silicon in TMAH and TMAH:TX100. It was found that the passi… Show more

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Cited by 18 publications
(16 citation statements)
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“…An anodic shift of the OCP with increased etching time was observed. This anodic shift was due to the exposure of the slow etching (111) planes as formation of the 'V' grooves occurs, as shown in figure 2(c) (since the OCP of p(111) Si is more anodic than the OCP for p(100) [26,27]). This anodic shifting started earlier during etching for the higher temperature, as was observed from the significantly sharper slope at 82 • C, compared to etching at 52 • C (figure 8).…”
Section: Surface Roughness and Etch Rate Measurementsmentioning
confidence: 93%
“…An anodic shift of the OCP with increased etching time was observed. This anodic shift was due to the exposure of the slow etching (111) planes as formation of the 'V' grooves occurs, as shown in figure 2(c) (since the OCP of p(111) Si is more anodic than the OCP for p(100) [26,27]). This anodic shifting started earlier during etching for the higher temperature, as was observed from the significantly sharper slope at 82 • C, compared to etching at 52 • C (figure 8).…”
Section: Surface Roughness and Etch Rate Measurementsmentioning
confidence: 93%
“…New techniques should be applied to improve the roundness of the 3D structure and modulate its curvature precisely. Recently, various additives have been studied to improve the etching characteristics of a TMAH solution [ 15 , 16 , 17 , 18 , 19 , 20 , 21 , 22 , 23 , 24 ]. Among these additives, C 14 H 22 O (C 2 H 4 O) n , n = 9–10 (Triton-X-100) can slow down the etching rate of the affected surface orientation, which is frequently exploited for new 3D microstructures.…”
Section: Introductionmentioning
confidence: 99%
“…5. In general, TMAH is more IC compatible, less toxic, and more stable [14] than other alkaline-based wet etchant, such as potassium hydroxide. SCS micromirrors made by wet etching are stress free and flat due to crystal orientation.…”
Section: Design and Fabricationmentioning
confidence: 99%