2000
DOI: 10.1016/s0039-6028(99)01170-x
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Electrochemical copper deposition on Au(100): a combined in situ STM and in situ surface X-ray diffraction study

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Cited by 65 publications
(44 citation statements)
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“…A qualitative fit (MSE = 5.7) was obtained for 0.17 -0.18 nm adlayer thickness. In spite of the model crudeness, this value compares well with the spacing between the gold surface and first copper layer, 1.74 ± 0.1Å reported in literature [22]. Indeed, a close look to data and simulations through difference spectra (insets of Fig.…”
Section: Resultssupporting
confidence: 89%
“…A qualitative fit (MSE = 5.7) was obtained for 0.17 -0.18 nm adlayer thickness. In spite of the model crudeness, this value compares well with the spacing between the gold surface and first copper layer, 1.74 ± 0.1Å reported in literature [22]. Indeed, a close look to data and simulations through difference spectra (insets of Fig.…”
Section: Resultssupporting
confidence: 89%
“…spiral dislocations, do not disappear [43], the discharge of copper continues. Direct STM evidence for the involvement of surface defects in the initial stages of metal electrodeposition processes has been reported by Kolb and coworkers [44]. Electrodeposited copper is well known [13] to be an active state of the metal, i.e.…”
Section: Electrodeposition Of Coppermentioning
confidence: 99%
“…A variety of in situ techniques are now available, including the electrochemical quartz crystal microbalance (EQCM), [1][2][3] electrochemical scanning tunnelling microscopy (STM) 4,5 and scanning electrochemical microscopy (SECM). [6][7][8][9][10] The SECM is a scanning probe microscopy (SPM), and as all SPMs, they operate by scanning or "rastering" a small probe tip over a surface to be investigated.…”
Section: Introductionmentioning
confidence: 99%