2010
DOI: 10.1016/j.mseb.2010.05.015
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Electrochemical deposition and studies on CdCr2S4 thin films

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Cited by 15 publications
(7 citation statements)
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“…6 All the three electrodes kept as close to each other with the optimum distance of 1 cm for uniform deposition. 20 Film thickness of NiX 2 (X=S, Se) was determined by gravimetric weight difference method using sensitive microbalance and assuming film density as close to the bulk density of the compounds. 20 X-ray diffraction (XRD) and scanning election microscopy (SEM) analysis were carried out in PANalytical ZPERT PROMPD PW 3040/60 diffractometer (for 2θ range from 20 to 70° with CuKα radiation) and SEM ZEIZZ EVO 50 scanning microscope, respectively and its composition analysis with energy dispersive X-ray (EDX) analysis.…”
Section: Characterization Of Electrodeposited Nix 2 Thin Filmsmentioning
confidence: 99%
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“…6 All the three electrodes kept as close to each other with the optimum distance of 1 cm for uniform deposition. 20 Film thickness of NiX 2 (X=S, Se) was determined by gravimetric weight difference method using sensitive microbalance and assuming film density as close to the bulk density of the compounds. 20 X-ray diffraction (XRD) and scanning election microscopy (SEM) analysis were carried out in PANalytical ZPERT PROMPD PW 3040/60 diffractometer (for 2θ range from 20 to 70° with CuKα radiation) and SEM ZEIZZ EVO 50 scanning microscope, respectively and its composition analysis with energy dispersive X-ray (EDX) analysis.…”
Section: Characterization Of Electrodeposited Nix 2 Thin Filmsmentioning
confidence: 99%
“…20 Film thickness of NiX 2 (X=S, Se) was determined by gravimetric weight difference method using sensitive microbalance and assuming film density as close to the bulk density of the compounds. 20 X-ray diffraction (XRD) and scanning election microscopy (SEM) analysis were carried out in PANalytical ZPERT PROMPD PW 3040/60 diffractometer (for 2θ range from 20 to 70° with CuKα radiation) and SEM ZEIZZ EVO 50 scanning microscope, respectively and its composition analysis with energy dispersive X-ray (EDX) analysis. Optical properties for determination of energy band gap of the films and semiconductor properties of the films studied using UV-Vis spectrophotometer and Mott-Schottky plot analysis, respectively.…”
Section: Characterization Of Electrodeposited Nix 2 Thin Filmsmentioning
confidence: 99%
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“…It is also observed that there is no change in crystal structure, but there is change in preferential orientation from (1 1 1) to (1 2 0) plane and increase in value of crystallinity is observed for films prepared at various solution pH values. Similar behaviour is exhibited for CdCr 2 S 4 thin films has been reported earlier [21]. The effect of deposition parameters (such as solution pH, bath temperature, deposition potential) on orientation of polycrystalline thin films are determined by evaluating the texture coefficient of the (h k l) plane using the following Eq.…”
Section: Structural Studiesmentioning
confidence: 54%
“…The optical band gap energy (E g ) was calculated from transmission spectra. The relationship of (αhν) 2 with photon energy (hν) is as follows [14]: 3000 rpm, respectively. It was observed that spin rates affect the E g of the DBSA/PSS/PPY composite thin films.…”
Section: Optical Properties Of Water-dispersed Dbsa/pss/ppy Compositementioning
confidence: 99%