Electrochemical Modification of Large Area Graphene and Characterization by Vibrational Spectroscopy

Hinrichs, Karsten; Shaykhutdinov, Timur; Kratz, Christoph; Rösicke, Felix; Schöniger, C.; Nickel, N. H.; Rappich, Jörg

doi:10.1016/b978-0-12-409547-2.14194-0

Cited by 5 publications

(20 citation statements)

References 48 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…8a). 52 The resulting PNA layer thickness on top of the 4.3 nm MP/G layer was estimated to be around 4.2 nm in the homogeneous regions (Fig. 8b) which indicates monolayer PNA functionalization with predominantly out-of-plane oriented twisted peptide-like backbones, i.e., “standing-up” configuration.…”

Section: Applicationsmentioning

confidence: 95%

“…8e) with random secondary structure. 52 By analogy with the previous example, further analyses can include DFT modeling of this system for a qualitative understanding of the complex spectral shapes of the amide I and II bands of PNA because they can also contain nucleobase contributions, 75 and their interactions with the backbone. 95…”

Section: Applicationsmentioning

confidence: 99%

“…For IR spectroscopic studies of anisotropic properties on macroscopic length scales, 35,43–75 infrared spectroscopic ellipsometry (IRSE) and polarimetry are the characterization methods of choice. 70–75 However, even in conjunction with brilliant light sources, the anisotropy connected with molecular ordering and morphology variations on the scale of 10–100 nm cannot be experimentally addressed because these IR techniques are diffraction limited far-field approaches.…”

Section: Introductionmentioning

confidence: 99%

“…Near-field concepts can be exploited for IR nanoscale studies with various kinds of measurement geometries. 37-47,49–69 The availability of brilliant IR radiation sources enabled new breakthroughs in IR instrumentation towards modern near-field microscopy. In addition, laser laboratory sources such as pulsed optical parametric oscillators (OPO) and pulsed laser sources, in particular tunable free-electron lasers (FEL), 57,65,66 were important to push the development.…”

Section: Introductionmentioning

confidence: 99%

“…Together with free azimuthal rotation of the sample the setup then enables polarimetric nanoscale measurements of anisotropic IR absorption. 36,52,64 Summarizing the current possibilities of IR analyses, AFM-IR is a unique method that can provide sensitive measurements of organic materials with lateral resolution approaching the AFM tip radius, 51 and probe both in-plane and out-of-plane vibrational components.

Figure 2.Schematic of AFM-IR measurement on an anisotropic sample in reflection geometry with polarization control for p - and s -polarized conditions.…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Hinrichs

Shaykhutdinov

2018

Appl Spectrosc

View full text Add to dashboard Cite

Infrared techniques enable nondestructive and label-free studies of thin films with high chemical and structural contrast. In this work, we review recent progress and perspectives in the nanoscale analysis of anisotropic materials using an extended version of the atomic force microscopy-infrared (AFM-IR) technique. This advanced photothermal technique, includes polarization control of the incoming light and bridges the gap in IR spectroscopic analysis of local anisotropic material properties. Such local anisotropy occurs in a wide range of materials during molecular nucleation, aggregation, and crystallization processes. However, analysis of the anisotropy in morphology and structure can be experimentally and theoretically demanding as it is related to order and disorder processes in ranges from nanoscopic to macroscopic length scales, depending on preparation and environmental conditions. In this context IR techniques can significantly assist as IR spectra can be interpreted in the framework of optical models and numerical calculations with respect to both, the present chemical conditions as well as the micro- and nanostructure. With these extraordinary analytic possibilities, the advanced AFM-IR approach is an essential puzzle piece in direction to connect nanoscale and macroscale anisotropic thin film properties experimentally. In this review, we highlight the analytic possibilities of AFM-IR for studies on nanoscale anisotropy with a set of examples for polymer, plasmonic, and polaritonic films, as well as aggregates of large molecules and proteins.

show abstract

Section: Applicationsmentioning

confidence: 95%

Section: Applicationsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Figure 2.Schematic of AFM-IR measurement on an anisotropic sample in reflection geometry with polarization control for p - and s -polarized conditions.…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Hinrichs

Shaykhutdinov

2018

Appl Spectrosc

View full text Add to dashboard Cite

show abstract

Quantum Dot Modification of Large Area Graphene Surfaces via Amide Bonding

Neubert,

Rösicke,

Hinrichs

et al. 2024

Adv Materials Inter

Self Cite

View full text Add to dashboard Cite

Large‐area graphene grown by chemical vapor deposition is functionalized by p‐aminophenyl groups via the diazonium‐route. Subsequently, carboxylic acid‐modified CdSXSe1‐X/ZnS dots (QDs) with maximum emission wavelengths of 540 nm and 630 nm are immobilized via amidation reaction to the amino‐functionalized graphene on the copper growth substrate forming stable covalent bonds in all functionalization steps. After immobilization of the QDs, the functional QD/graphene stack is available for transfer from the growth substrate onto any other substrate. In this study, the QD‐modified graphene is transferred to a Si wafer with surface oxide without losing the QD modification. The successful binding of the QDs onto the functionalized graphene is characterized by their vibrational signature using Raman backscattering and infrared‐spectroscopic ellipsometry and by their specific light emission as measured by photoluminescence (PL) spectroscopy.

show abstract

Infrared and Raman spectroscopic analysis of functionalized graphene

et al. 2022

View full text Add to dashboard Cite

In this mini‐review, we discuss our work in the analysis of material properties of electrochemically functionalized graphene using infrared (IR) and Raman techniques as thin film sensitive vibrational spectroscopies. Multiscale characterization is demonstrated using a combination of IR spectroscopic ellipsometry (IRSE), confocal Raman spectroscopy (RS) and photothermal atomic force microscopy coupled IR analysis (AFM‐IR). IRSE is used for spots with dimensions of a few mm, RS for spots with a diameter of a few micrometer and AFM‐IR at the sub‐100 nm scale. In the first part of the article, functionalized large‐area graphene sheets electrochemically modified by ultrathin oligomer films of maleimidophenyl or 4‐aminophenyl acetic acid are studied. Characteristic molecular vibrations of the functional layers are analyzed by the IR methods, while the graphene‐related phonons are characterized by RS. This dual approach allowed for the determination of the attached functional groups as well as the identification of the nature of chemical coupling of the functional moieties to graphene. The thickness of the deposited layers extracted from IRSE data correlates very well with AFM measurements. In the second part of the article, functionalized graphene sheets are characterized by correlative vibrational optical spectroscopy directly at a device level.

show abstract

Electrochemical Modification of Large Area Graphene and Characterization by Vibrational Spectroscopy

Cited by 5 publications

References 48 publications

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Quantum Dot Modification of Large Area Graphene Surfaces via Amide Bonding

Infrared and Raman spectroscopic analysis of functionalized graphene

Contact Info

Product

Resources

About