2010
DOI: 10.1016/j.jelechem.2010.06.012
|View full text |Cite
|
Sign up to set email alerts
|

Electrochemical nucleation and growth of black and white chromium deposits onto stainless steel surfaces

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

2
9
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 20 publications
(11 citation statements)
references
References 25 publications
2
9
0
Order By: Relevance
“…Since the EDX analysis extends deep in the sample depending on the electron acceleration (kV), the amount of substrate detected can be used to compare the thickness of two different layers. Table 1 shows that the amount of Ti detected is much higher for the surface No clear X-ray diffraction patterns were obtained for the deposits, which is in line with previous findings [26,38].…”
Section: Cr 2 O 3 and Cr(oh)supporting
confidence: 89%
“…Since the EDX analysis extends deep in the sample depending on the electron acceleration (kV), the amount of substrate detected can be used to compare the thickness of two different layers. Table 1 shows that the amount of Ti detected is much higher for the surface No clear X-ray diffraction patterns were obtained for the deposits, which is in line with previous findings [26,38].…”
Section: Cr 2 O 3 and Cr(oh)supporting
confidence: 89%
“…XPS has thrown some light towards characterizing this type of films [29,32,39,40], showing either a pure Cr 2 O 3 phase [29,39], a mixture of Cr 2 O 3 and Cr(OH) 3 [40], or a much more complex matrix of different Cr(III) oxyhydroxides [32]. The XPS investigation made in the present work (Fig.…”
Section: Surface Characterizationmentioning
confidence: 70%
“…It is known that the electrodeposition of so-called black chromium yields amorphous Cr(III) oxide films/deposits [29,32,39], whose actual composition is difficult to determine [32]. XPS has thrown some light towards characterizing this type of films [29,32,39,40], showing either a pure Cr 2 O 3 phase [29,39], a mixture of Cr 2 O 3 and Cr(OH) 3 [40], or a much more complex matrix of different Cr(III) oxyhydroxides [32].…”
Section: Surface Characterizationmentioning
confidence: 99%
“…[] X‐ray photoelectron spectroscopy (XPS), another powerful technique for compositional characterization, has been employed to identify oxygenated Cr(III) species, as powders or films. [] However, the drawback of using XPS is that some peaks superpose at determined intervals of binding energies for Cr(OH) 3 and Cr 2 O 3 ,[] whereby a clear distinction between the two species is not feasible. As an alternative to FTIR and XPS, Raman spectroscopy has shown to be a suitable and important technique to characterize Cr 2 O 3 ,[] which in the crystalline form presents several distinct peaks.…”
Section: Introductionmentioning
confidence: 99%