Abstract:Copper sulfide-selenide (CuS 0.2 Se 0.8 ) thin films were deposited on FTO coated glass substrate (fluorine doped tin oxide) and stainless steel substrates using electrodeposition technique. Deposited thin films were characterized using different characterization techniques viz. X-ray diffraction (XRD), scanning electron microscopy (SEM), UV-Vis spectroscopy, photoluminescence spectroscopy and surface wettability. XRD study showed polycrystalline nature with cubic phase of the films. Scanning electron microsco… Show more
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