2019 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) 2019
DOI: 10.1109/eexpolytech.2019.8906859
|View full text |Cite
|
Sign up to set email alerts
|

Electroforming and Resistive Switching in Aluminum Oxide Thin Films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2022
2022

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 5 publications
0
1
0
Order By: Relevance
“…However, in the case of metal oxide‐based resistive switching memory, a relatively high voltage is required to form the nanofilament inside the resistive switching layer in order to operate the resistive switching behavior. [ 14 , 25 , 26 ] Usually, in the electroforming process, a voltage greater than the switching voltage of the resistive switching memory is required. A large electroforming voltage has naturally emerged as a major issue in resistive switching memory and many studies are being conducted to improve the high electroforming voltage issue.…”
Section: Introductionmentioning
confidence: 99%
“…However, in the case of metal oxide‐based resistive switching memory, a relatively high voltage is required to form the nanofilament inside the resistive switching layer in order to operate the resistive switching behavior. [ 14 , 25 , 26 ] Usually, in the electroforming process, a voltage greater than the switching voltage of the resistive switching memory is required. A large electroforming voltage has naturally emerged as a major issue in resistive switching memory and many studies are being conducted to improve the high electroforming voltage issue.…”
Section: Introductionmentioning
confidence: 99%